{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T14:20:35Z","timestamp":1725805235363},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3,21]]},"DOI":"10.1109\/lats58125.2023.10154492","type":"proceedings-article","created":{"date-parts":[[2023,6,24]],"date-time":"2023-06-24T00:24:05Z","timestamp":1687566245000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["On the integration and hardening of Software Test Libraries in Real-Time Operating Systems"],"prefix":"10.1109","author":[{"given":"Francesco","family":"Angione","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}]},{"given":"Paolo","family":"Bernardi","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}]},{"given":"Riccardo","family":"Cantoro","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}]},{"given":"Nicola","family":"Di Gruttola Giardino","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}]},{"given":"Davide","family":"Piumatti","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}]},{"given":"Davide","family":"Appello","sequence":"additional","affiliation":[{"name":"ST Microelectronics,Italy"}]},{"given":"Vincenzo","family":"Tancorre","sequence":"additional","affiliation":[{"name":"ST Microelectronics,Italy"}]}],"member":"263","event":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","start":{"date-parts":[[2023,3,21]]},"location":"Veracruz, Mexico","end":{"date-parts":[[2023,3,24]]}},"container-title":["2023 IEEE 24th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10154476\/10154477\/10154492.pdf?arnumber=10154492","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,10]],"date-time":"2023-07-10T17:57:49Z","timestamp":1689011869000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10154492\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3,21]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/lats58125.2023.10154492","relation":{},"subject":[],"published":{"date-parts":[[2023,3,21]]}}}