{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T09:03:22Z","timestamp":1765357402577},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3,21]]},"DOI":"10.1109\/lats58125.2023.10154495","type":"proceedings-article","created":{"date-parts":[[2023,6,23]],"date-time":"2023-06-23T20:24:05Z","timestamp":1687551845000},"page":"1-6","source":"Crossref","is-referenced-by-count":8,"title":["Feature Selection for Cost Reduction In MCU Performance Screening"],"prefix":"10.1109","author":[{"given":"Nicol\u00f2","family":"Bellarmino","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Torino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Riccardo","family":"Cantoro","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Torino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martin","family":"Huch","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG,Munich,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tobias","family":"Kilian","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG,Munich,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[{"name":"Technical University of Munich,Munich,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giovanni","family":"Squillero","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Torino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","start":{"date-parts":[[2023,3,21]]},"location":"Veracruz, Mexico","end":{"date-parts":[[2023,3,24]]}},"container-title":["2023 IEEE 24th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10154476\/10154477\/10154495.pdf?arnumber=10154495","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,10]],"date-time":"2023-07-10T13:57:48Z","timestamp":1688997468000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10154495\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3,21]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/lats58125.2023.10154495","relation":{},"subject":[],"published":{"date-parts":[[2023,3,21]]}}}