{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,5]],"date-time":"2026-03-05T15:33:36Z","timestamp":1772724816051,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3,21]]},"DOI":"10.1109\/lats58125.2023.10154503","type":"proceedings-article","created":{"date-parts":[[2023,6,24]],"date-time":"2023-06-24T00:24:05Z","timestamp":1687566245000},"page":"1-6","source":"Crossref","is-referenced-by-count":8,"title":["Evaluating a New RRAM Manufacturing Test Strategy"],"prefix":"10.1109","author":[{"given":"T. S.","family":"Copetti","sequence":"first","affiliation":[{"name":"RWTH Aachen University,Chair of Integrated Digital Systems and Circuit Design - IDS,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Castelnuovo","sequence":"additional","affiliation":[{"name":"NXP Semiconductors,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Gemmeke","sequence":"additional","affiliation":[{"name":"RWTH Aachen University,Chair of Integrated Digital Systems and Circuit Design - IDS,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L. M. Bolzani","family":"Poehls","sequence":"additional","affiliation":[{"name":"RWTH Aachen University,Chair of Integrated Digital Systems and Circuit Design - IDS,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190812"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3510851"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-021-05968-8"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.206"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00085"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LATS57337.2022.9936991"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3018502"},{"key":"ref8","volume-title":"JART-J\u00fclich Aachen Resistive Switching Tools, model JART VCM v1b readvar","year":"2023"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1971.1083337"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-1101-9"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624819"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2013.219"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310392"},{"issue":"5","key":"ref15","first-page":"863","article-title":"A current-controlled latch sense amplifier and a static power-saving input buffer for low-power architecture","volume":"76","author":"Kobayashi","year":"1993","journal-title":"IEICE transactions on electronics"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9163014"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LATS53581.2021.9651789"}],"event":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","location":"Veracruz, Mexico","start":{"date-parts":[[2023,3,21]]},"end":{"date-parts":[[2023,3,24]]}},"container-title":["2023 IEEE 24th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10154476\/10154477\/10154503.pdf?arnumber=10154503","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:43:21Z","timestamp":1725428601000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10154503\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3,21]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/lats58125.2023.10154503","relation":{},"subject":[],"published":{"date-parts":[[2023,3,21]]}}}