{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T09:31:11Z","timestamp":1730280671813,"version":"3.28.0"},"reference-count":33,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T00:00:00Z","timestamp":1679356800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,3,21]]},"DOI":"10.1109\/lats58125.2023.10154504","type":"proceedings-article","created":{"date-parts":[[2023,6,24]],"date-time":"2023-06-24T00:24:05Z","timestamp":1687566245000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs"],"prefix":"10.1109","author":[{"given":"Josie E.","family":"Rodriguez Condia","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Department of Control and Computer Engineering (DAUIN)"}]},{"given":"Juan-David","family":"Guerrero-Balaguera","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Department of Control and Computer Engineering (DAUIN)"}]},{"given":"Edwar J.","family":"Pati\u00f1o N\u00fa\u00f1ez","sequence":"additional","affiliation":[{"name":"Universidad Pedagogica y Tecnologica de Colombia (UPTC) - Electronic Engineering School"}]},{"given":"Robert","family":"Limas","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Department of Control and Computer Engineering (DAUIN)"}]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Department of Control and Computer Engineering (DAUIN)"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.040"},{"volume-title":"Computer architecture: a quantitative approach","year":"2012","author":"Hennessy","key":"ref2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MCSE.2009.204"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791554"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2013.6562683"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.2977583"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-W.2017.16"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2016.7482075"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2016.7482077"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/isca52012.2021.00075"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/vts.2018.8368665"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.07.007"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2019.8704643"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI49217.2020.00076"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS50974.2021.9441044"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DSN48987.2021.00042"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI54635.2022.00018"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2022.3166260"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID57277.2023.00077"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICDSP.2015.7251840"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/BEC49624.2020.9276748"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113660"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS52668.2021.9417025"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-22750-0_49"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/12.295858"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.52"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674723"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/1478786.1478840"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s11265-009-0370-3"},{"issue":"2","key":"ref30","first-page":"171","article-title":"A survey on fault injection techniques","volume":"1","author":"Ziade","year":"2004","journal-title":"Int. Arab J. Inf. Technol."},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847793"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/2717764.2717783"}],"event":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","start":{"date-parts":[[2023,3,21]]},"location":"Veracruz, Mexico","end":{"date-parts":[[2023,3,24]]}},"container-title":["2023 IEEE 24th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10154476\/10154477\/10154504.pdf?arnumber=10154504","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,25]],"date-time":"2024-06-25T18:23:33Z","timestamp":1719339813000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10154504\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3,21]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/lats58125.2023.10154504","relation":{},"subject":[],"published":{"date-parts":[[2023,3,21]]}}}