{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T16:29:42Z","timestamp":1783787382628,"version":"3.55.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,9]],"date-time":"2024-04-09T00:00:00Z","timestamp":1712620800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,9]],"date-time":"2024-04-09T00:00:00Z","timestamp":1712620800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,9]]},"DOI":"10.1109\/lats62223.2024.10534600","type":"proceedings-article","created":{"date-parts":[[2024,5,28]],"date-time":"2024-05-28T17:35:14Z","timestamp":1716917714000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs"],"prefix":"10.1109","author":[{"given":"T. S.","family":"Copetti","sequence":"first","affiliation":[{"name":"RWTH Aachen University,Chair of Integrated Digital Systems and Circuit Design - IDS,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"A.","family":"Chordia","sequence":"additional","affiliation":[{"name":"RWTH Aachen University,Chair of Integrated Digital Systems and Circuit Design - IDS,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M.","family":"Fieback","sequence":"additional","affiliation":[{"name":"TU Delft,Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M.","family":"Taouil","sequence":"additional","affiliation":[{"name":"TU Delft,Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S.","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"TU Delft,Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"L. M.","family":"Bolzani Poehls","sequence":"additional","affiliation":[{"name":"RWTH Aachen University,Chair of Integrated Digital Systems and Circuit Design - IDS,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927083"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/9781118958254.ch09"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-1101-9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176603"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.206"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3510851"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000134"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624895"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-021-05968-8"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LATS57337.2022.9936991"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LATS58125.2023.10154503"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624819"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-024-06108-8"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2013.219"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465401"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3018502"},{"key":"ref18","volume-title":"JART \u2013 J\u00fclich Aachen Resistive Switching Tools, model JART VCM"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LATS53581.2021.9651789"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2911661"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3510851"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843856"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.66"}],"event":{"name":"2024 IEEE 25th Latin American Test Symposium (LATS)","location":"Maceio, Brazil","start":{"date-parts":[[2024,4,9]]},"end":{"date-parts":[[2024,4,12]]}},"container-title":["2024 IEEE 25th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10534343\/10534590\/10534600.pdf?arnumber=10534600","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T04:41:40Z","timestamp":1716957700000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10534600\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,9]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/lats62223.2024.10534600","relation":{},"subject":[],"published":{"date-parts":[[2024,4,9]]}}}