{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,12]],"date-time":"2025-05-12T16:33:28Z","timestamp":1747067608445},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,9]],"date-time":"2024-04-09T00:00:00Z","timestamp":1712620800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,9]],"date-time":"2024-04-09T00:00:00Z","timestamp":1712620800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002701","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002701","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,9]]},"DOI":"10.1109\/lats62223.2024.10534601","type":"proceedings-article","created":{"date-parts":[[2024,5,28]],"date-time":"2024-05-28T17:35:14Z","timestamp":1716917714000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Cycle-Accurate FPGA Emulation of RRAM Crossbar Array: Efficient Device and Variability Modeling with Energy Consumption Assessment"],"prefix":"10.1109","author":[{"given":"Jianan","family":"Wen","sequence":"first","affiliation":[{"name":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fabian Luis","family":"Vargas","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fukun","family":"Zhu","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel","family":"Reiser","sequence":"additional","affiliation":[{"name":"University of Rostock,Rostock,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrea","family":"Baroni","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Markus","family":"Fritscher","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eduardo","family":"Perez","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marc","family":"Reichenbach","sequence":"additional","affiliation":[{"name":"University of Rostock,Rostock,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Wenger","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-022-04992-8"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3122343"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10060645"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LATS53581.2021.9651789"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS46558.2021.9405210"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS57931.2023.10198076"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT56152.2022.9962345"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2017.2776980"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS52668.2021.9417070"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3611315.3633273"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993491"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-40843-4_37"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2889670"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401762"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1126\/science.ade3483"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2931769"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2022.3182133"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/78.324744"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2021.3092533"}],"event":{"name":"2024 IEEE 25th Latin American Test Symposium (LATS)","start":{"date-parts":[[2024,4,9]]},"location":"Maceio, Brazil","end":{"date-parts":[[2024,4,12]]}},"container-title":["2024 IEEE 25th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10534343\/10534590\/10534601.pdf?arnumber=10534601","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T04:41:42Z","timestamp":1716957702000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10534601\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,9]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/lats62223.2024.10534601","relation":{},"subject":[],"published":{"date-parts":[[2024,4,9]]}}}