{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T11:17:58Z","timestamp":1762255078024,"version":"3.40.4"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T00:00:00Z","timestamp":1741651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T00:00:00Z","timestamp":1741651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,11]]},"DOI":"10.1109\/lats65346.2025.10963947","type":"proceedings-article","created":{"date-parts":[[2025,4,17]],"date-time":"2025-04-17T17:38:31Z","timestamp":1744911511000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs"],"prefix":"10.1109","author":[{"given":"Francesco","family":"Angione","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo","family":"Bernardi","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Claudia","family":"Bertani","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Agrate Brianza,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lorenzo","family":"Bertetto","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lorenzo","family":"Cardone","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicola","family":"Di Gruttola Giardino","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stefano","family":"Quer","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincenzo","family":"Tancorre","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Agrate Brianza,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/ATS49688.2020.9301557"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/VLSI-DAT.2018.8373238"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/IOLTS52814.2021.9486708"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TC.2024.3500375"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/DDECS.2019.8724644"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ITC50671.2022.00044"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ETS61313.2024.10567817"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/HPCA56546.2023.10071105"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/EPTC.2014.7028421"},{"key":"ref10","article-title":"Towards an automated flow for implementation ofdedicated lbist scan chains for functional safety","volume-title":"TUZ","author":"Tille","year":"2021"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/DATE.2012.6176505"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/ETS56758.2023.10173985"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1007\/3-540-45657-0_38"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.3390\/computation11040069"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/ACCESS.2023.3329082"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/DFT63277.2024.10753536"}],"event":{"name":"2025 IEEE 26th Latin American Test Symposium (LATS)","start":{"date-parts":[[2025,3,11]]},"location":"San Andres Islas, Colombia","end":{"date-parts":[[2025,3,14]]}},"container-title":["2025 IEEE 26th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10963875\/10963934\/10963947.pdf?arnumber=10963947","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,19]],"date-time":"2025-04-19T04:38:09Z","timestamp":1745037489000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10963947\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,11]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/lats65346.2025.10963947","relation":{},"subject":[],"published":{"date-parts":[[2025,3,11]]}}}