{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,27]],"date-time":"2026-05-27T22:15:05Z","timestamp":1779920105040,"version":"3.53.1"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T00:00:00Z","timestamp":1741651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T00:00:00Z","timestamp":1741651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002301","name":"Estonian Research Council","doi-asserted-by":"publisher","award":["PUT PRG1467"],"award-info":[{"award-number":["PUT PRG1467"]}],"id":[{"id":"10.13039\/501100002301","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100000780","name":"EU","doi-asserted-by":"publisher","award":["101160182"],"award-info":[{"award-number":["101160182"]}],"id":[{"id":"10.13039\/501100000780","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["458578717"],"award-info":[{"award-number":["458578717"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,11]]},"DOI":"10.1109\/lats65346.2025.10963948","type":"proceedings-article","created":{"date-parts":[[2025,4,17]],"date-time":"2025-04-17T17:38:31Z","timestamp":1744911511000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Reliability-Aware Performance Optimization of DNN HW Accelerators Through Heterogeneous Quantization"],"prefix":"10.1109","author":[{"given":"Samira","family":"Nazari","sequence":"first","affiliation":[{"name":"University of Zanjan,Zanjan,Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mahdi","family":"Taheri","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ali","family":"Azarpeyvand","sequence":"additional","affiliation":[{"name":"University of Zanjan,Zanjan,Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mohsen","family":"Afsharchi","sequence":"additional","affiliation":[{"name":"University of Zanjan,Zanjan,Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christian","family":"Herglotz","sequence":"additional","affiliation":[{"name":"Brandenburgische Technische Universität Cottbus,Cottbus,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maksim","family":"Jenihhin","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Dnn hardware reliability assessment and enhancement","volume-title":"27th IEEE European Test Symposium (ETS).","author":"Taheri","year":"2022"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ETS61313.2024.10567161"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED57927.2023.10129353"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS57966.2023.10168633"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS64447.2024.10915463"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC62099.2024.10767798"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED60706.2024.10528372"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS60919.2024.10508925"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00286"},{"key":"ref10","article-title":"Genie: Genetic algorithm-based reliability assessment methodology for deep neural networks","volume-title":"11 th International Conference on Computing and Artificial Intelligence","author":"Nazari","year":"2025"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC47756.2020.9045134"}],"event":{"name":"2025 IEEE 26th Latin American Test Symposium (LATS)","location":"San Andres Islas, Colombia","start":{"date-parts":[[2025,3,11]]},"end":{"date-parts":[[2025,3,14]]}},"container-title":["2025 IEEE 26th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10963875\/10963934\/10963948.pdf?arnumber=10963948","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:09:48Z","timestamp":1744952988000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10963948\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,11]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/lats65346.2025.10963948","relation":{},"subject":[],"published":{"date-parts":[[2025,3,11]]}}}