{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T06:00:04Z","timestamp":1777874404380,"version":"3.51.4"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T00:00:00Z","timestamp":1773705600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T00:00:00Z","timestamp":1773705600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002322","name":"CAPES","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002322","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004263","name":"FAPERGS","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004263","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003593","name":"CNPq","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,3,17]]},"DOI":"10.1109\/lats70329.2026.11480339","type":"proceedings-article","created":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T19:51:29Z","timestamp":1776455489000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Mitigation of SETs Under Process Variability Effects: Circuit-Level Strategies for Reliable Design"],"prefix":"10.1109","author":[{"given":"Marina L.","family":"Dias","sequence":"first","affiliation":[{"name":"Universidade Federal de Santa Catarina - UFSC,Florianópolis,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bernardo B.","family":"Sandoval","sequence":"additional","affiliation":[{"name":"Universidade Federal de Santa Catarina - UFSC,Florianópolis,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paulo F.","family":"Butzen","sequence":"additional","affiliation":[{"name":"PGMicro-Universidade Federal do Rio Grande do Sul - UFRGS,Porto Alegre,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ricardo A. L.","family":"Reis","sequence":"additional","affiliation":[{"name":"PGMicro-Universidade Federal do Rio Grande do Sul - UFRGS,Porto Alegre,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cristina","family":"Meinhardt","sequence":"additional","affiliation":[{"name":"Universidade Federal de Santa Catarina - UFSC,Florianópolis,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3180303"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3483223"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.04.006"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2171994"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICREED59404.2023.10390726"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.023"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2019.8920336"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/ip-g-1.1984.0037"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2013.6674775"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-53273-4_3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2019.8920297"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS61496.2024.10848717"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/INDCON.2009.5409457"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2018.8617996"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-68368-9"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.12.018"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT59917.2023.10332341"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3138501"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/electronics14153131"},{"key":"ref20","first-page":"4241","article-title":"Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system","author":"Victor","year":"1990","journal-title":"NASA Technical Memorandum"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.109"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI66862.2025.11218667"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS60203.2024.10506171"}],"event":{"name":"2026 IEEE 27th Latin American Test Symposium (LATS)","location":"Florian\u00f3polis, Brazil","start":{"date-parts":[[2026,3,17]]},"end":{"date-parts":[[2026,3,20]]}},"container-title":["2026 IEEE 27th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11480270\/11480273\/11480339.pdf?arnumber=11480339","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T19:45:39Z","timestamp":1777578339000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11480339\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3,17]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/lats70329.2026.11480339","relation":{},"subject":[],"published":{"date-parts":[[2026,3,17]]}}}