{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T05:02:03Z","timestamp":1776488523353,"version":"3.51.2"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T00:00:00Z","timestamp":1773705600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T00:00:00Z","timestamp":1773705600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,3,17]]},"DOI":"10.1109\/lats70329.2026.11480358","type":"proceedings-article","created":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T19:51:29Z","timestamp":1776455489000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Soft Error Mitigation in a Real-Time Control System Through Hardware Protection on an SRAM-Based FPGA"],"prefix":"10.1109","author":[{"given":"A.","family":"Giuffra","sequence":"first","affiliation":[{"name":"Universidad de Ingenieria y Tecnologia,Electronic and Mechatronic Department,Lima,Perú"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Minaya","sequence":"additional","affiliation":[{"name":"Universidad de Ingenieria y Tecnologia,Electronic and Mechatronic Department,Lima,Perú"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Tarrillo","sequence":"additional","affiliation":[{"name":"Universidad de Ingenieria y Tecnologia,Electronic and Mechatronic Department,Lima,Perú"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2240697"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"2400","DOI":"10.1109\/TNS.2024.3474746","article-title":"Mixed-Field Radiation of 3-D MLC Flash Memories for Space Applications","volume":"71","author":"Gonzales","year":"2024","journal-title":"IEEE Transactions on Nuclear Science"},{"key":"ref3","first-page":"30","article-title":"Testing guidelines for single event transient (SET) testing of linear devices","author":"Poivey","year":"2003","journal-title":"NASA NEPP and ERC, DTRA"},{"key":"ref4","article-title":"Guidelines for the Determination of Standardized Semiconductor Radiation Hardness Parameters","author":"Atomic","year":"2023","journal-title":"Technical Reports Series No.490, IAEA, Vienna"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2015.2452781"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2404212"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2016.8093209"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2023.3265740"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2916151"},{"key":"ref10","article-title":"Testing guidelines for single event transient (set) testing of linear devices","author":"Poivey","year":"2003","journal-title":"NASA Electronic Parts and Packaging (NEPP) Program Electronics Radiation Characterization (ERC) Project"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2240697"},{"key":"ref12","article-title":"High-reliability FPGA-based systems: Space, high-energy physics, and beyond","author":"Edwards","year":"2004","journal-title":"IEEE Transactions on Nuclear Science"},{"key":"ref13","article-title":"Exploring the Use of Multiple Modular Redundancies for Masking Accumulated Faults in SRAM-based FPGAs","author":"Tarrillo","journal-title":"Universidade Federal do Rio Grande do Sul. Instituto de Informatica 2014"},{"key":"ref14","article-title":"HeterogeneousRTOS: A CPU-FPGA fault-tolerant real-time operating system","author":"Francesco","year":"2021","journal-title":"Politecnico di Milano"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/itc51657.2024.00039"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1108\/JICV-03-2021-0002"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/2388\/1\/012048"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2939858"}],"event":{"name":"2026 IEEE 27th Latin American Test Symposium (LATS)","location":"Florian\u00f3polis, Brazil","start":{"date-parts":[[2026,3,17]]},"end":{"date-parts":[[2026,3,20]]}},"container-title":["2026 IEEE 27th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11480270\/11480273\/11480358.pdf?arnumber=11480358","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T04:33:36Z","timestamp":1776486816000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11480358\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3,17]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/lats70329.2026.11480358","relation":{},"subject":[],"published":{"date-parts":[[2026,3,17]]}}}