{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T06:00:07Z","timestamp":1777874407454,"version":"3.51.4"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T00:00:00Z","timestamp":1773705600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T00:00:00Z","timestamp":1773705600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002322","name":"CAPES","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002322","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004263","name":"FAPERGS","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004263","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,3,17]]},"DOI":"10.1109\/lats70329.2026.11480361","type":"proceedings-article","created":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T19:51:29Z","timestamp":1776455489000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Susceptibility Evaluation of Layout-Based 2:1 Multiplexer Topologies"],"prefix":"10.1109","author":[{"given":"Ana Fl\u00e1via D.","family":"Reis","sequence":"first","affiliation":[{"name":"Centro de Ciências Computacionais - Universidade Federal do Rio Grande - FURG - Rio Grande,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eduardo A. C.","family":"da Costa","sequence":"additional","affiliation":[{"name":"Centro de Ciências Computacionais - Universidade Federal do Rio Grande - FURG - Rio Grande,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rafael B.","family":"Schvittz","sequence":"additional","affiliation":[{"name":"Centro de Ciências Computacionais - Universidade Federal do Rio Grande - FURG - Rio Grande,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.886044"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/mi15070885"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/mi15091158"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2023.102094"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16754"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"issue":"3","key":"ref7","first-page":"343","article-title":"The impact of new technology on soft errors in digital integrated circuits","volume":"5","author":"Dixit","year":"2005","journal-title":"IEEE Transactions on Device and Materials Reliability"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2008.4509329"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.145"},{"key":"ref10","article-title":"Tmux582f-sep single-event effects (see) radiation report","author":"Instruments","year":"2024","journal-title":"Texas Instruments Incorporated, Tech. Rep."},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2019.8795296"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS61496.2024.10848873"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/electronics14153010"},{"issue":"15","key":"ref14","doi-asserted-by":"crossref","DOI":"10.3390\/electronics14153010","article-title":"Design and evaluation of radiation-tolerant 2:1 cmos multiplexers in 32 nm technology node: Transistor-level mitigation strategies and performance trade-offs","volume":"14","author":"Reis","year":"2025","journal-title":"Electronics"},{"key":"ref15","volume-title":"Klayout: High performance layout viewer and editor","author":"Developers","year":"2025"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2024.3372907"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS64004.2025.10966333"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/EURDAC.1993.410633"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44778.2020.9325252"},{"key":"ref20","volume-title":"Ngspice users manual version 44 (describes ngspice-44 release version)","author":"Holger","year":"2024"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"},{"key":"ref22","article-title":"Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system","author":"Carreno","year":"1990","journal-title":"NASA, Tech. Rep."}],"event":{"name":"2026 IEEE 27th Latin American Test Symposium (LATS)","location":"Florian\u00f3polis, Brazil","start":{"date-parts":[[2026,3,17]]},"end":{"date-parts":[[2026,3,20]]}},"container-title":["2026 IEEE 27th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11480270\/11480273\/11480361.pdf?arnumber=11480361","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T19:45:38Z","timestamp":1777578338000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11480361\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3,17]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/lats70329.2026.11480361","relation":{},"subject":[],"published":{"date-parts":[[2026,3,17]]}}}