{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T09:31:26Z","timestamp":1730280686807,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,3]]},"DOI":"10.1109\/latw.2009.4813811","type":"proceedings-article","created":{"date-parts":[[2009,4,10]],"date-time":"2009-04-10T19:39:46Z","timestamp":1239392386000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Radiation damage characterization of digital integrated circuits"],"prefix":"10.1109","author":[{"given":"Santiago","family":"Sondon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pablo","family":"Mandolesi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pedro","family":"Julian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Felix","family":"Palumbo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martin","family":"Alurralde","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alberto","family":"Filevich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2008.4526463"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.1998.731487"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.1999.816059"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1142\/3655"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336431"},{"year":"0","key":"1"},{"key":"10","first-page":"265","article-title":"total dose hardness ofthree commercial cmos microelectronics foundries, radiation and its effects on components and systems","volume":"97","author":"osborn","year":"1997","journal-title":"RADECS"},{"key":"7","first-page":"593","article-title":"radiation hardened cots-based 32-bit microprocessor, radiation and its effects on components and systems","author":"haddad","year":"1999"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/5.90114"},{"year":"0","key":"5"},{"key":"4","article-title":"a path toward low cost radtolerant digital cmos","author":"gambles","year":"0","journal-title":"6th Nasa Symposium on VLSI Design 1997"},{"year":"0","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2001.931187"}],"event":{"name":"2009 10th Latin American Test Workshop","start":{"date-parts":[[2009,3,2]]},"location":"Rio de Janeiro, Brazil","end":{"date-parts":[[2009,3,5]]}},"container-title":["2009 10th Latin American Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4810097\/4813774\/04813811.pdf?arnumber=4813811","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T19:02:23Z","timestamp":1489777343000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4813811\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/latw.2009.4813811","relation":{},"subject":[],"published":{"date-parts":[[2009,3]]}}}