{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T09:31:27Z","timestamp":1730280687982,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,3]]},"DOI":"10.1109\/latw.2009.4813819","type":"proceedings-article","created":{"date-parts":[[2009,4,10]],"date-time":"2009-04-10T15:39:46Z","timestamp":1239377986000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Execution time reduction of Differential Power Analysis experiments"],"prefix":"10.1109","author":[{"given":"Giorgio","family":"Di Natale","sequence":"first","affiliation":[]},{"given":"Marie-Lise","family":"Flottes","sequence":"additional","affiliation":[]},{"given":"Bruno","family":"Rouzeyre","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.61"},{"year":"0","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2008.61"},{"key":"1","first-page":"388","article-title":"differential power analysis","author":"kocher","year":"1999","journal-title":"Proc Crypto"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1007\/BF00993128"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/5.843000"},{"key":"5","first-page":"211","article-title":"dpa on faulty cryptographic hardware and countermeasures, in workshop on fault diagnosis and tolerance in cryptography (fdtc)","volume":"4236","author":"kulikowski","year":"2006","journal-title":"LNCS"},{"key":"4","first-page":"1280","author":"kulikowski","year":"2008","journal-title":"Power Balanced Gates Insensitive to Routing Capacitance Mismatch"},{"year":"2001","key":"9","article-title":"advanced encryption standard (aes)"},{"year":"0","key":"8"}],"event":{"name":"2009 10th Latin American Test Workshop","start":{"date-parts":[[2009,3,2]]},"location":"Rio de Janeiro, Brazil","end":{"date-parts":[[2009,3,5]]}},"container-title":["2009 10th Latin American Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4810097\/4813774\/04813819.pdf?arnumber=4813819","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T15:10:10Z","timestamp":1489763410000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4813819\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/latw.2009.4813819","relation":{},"subject":[],"published":{"date-parts":[[2009,3]]}}}