{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T23:57:15Z","timestamp":1725494235847},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/latw.2010.5550342","type":"proceedings-article","created":{"date-parts":[[2010,8,24]],"date-time":"2010-08-24T15:37:50Z","timestamp":1282664270000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["BICS-based March test for resistive-open defect detection in SRAMs"],"prefix":"10.1109","author":[{"given":"R.","family":"Chipana","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Bolzani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Vargas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"45","article-title":"A Low-Cost, Highly Reliable SEU-Tolerant SRAM: Prototype and Test Results, IEEE Transactions on Nuclear Science, Vol. 42, N. 6, December 1995","author":"calin","year":"1995","journal-title":"IEEE International Test Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1988.122524"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/54.46891"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.36"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743133"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966731"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2004.1347645"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.75"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1993.393307"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/el:19900779"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/54.199799"},{"journal-title":"Semiconductor Industry Association (SIA)","article-title":"International Technology Roadmap for Semiconductors (ITRS)","year":"2003","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315652"}],"event":{"name":"2010 11th Latin American Test Workshop - LATW","start":{"date-parts":[[2010,3,28]]},"location":"Punta del Este, Uruguay","end":{"date-parts":[[2010,3,31]]}},"container-title":["2010 11th Latin American Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5542405\/5550333\/05550342.pdf?arnumber=5550342","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T05:17:09Z","timestamp":1489900629000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5550342\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/latw.2010.5550342","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}