{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T21:05:20Z","timestamp":1725570320670},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/latw.2010.5550346","type":"proceedings-article","created":{"date-parts":[[2010,8,24]],"date-time":"2010-08-24T15:37:50Z","timestamp":1282664270000},"page":"1-8","source":"Crossref","is-referenced-by-count":13,"title":["The limitations of software signature and basic block sizing in soft error fault coverage"],"prefix":"10.1109","author":[{"given":"Jose Rodrigo","family":"Azambuja","sequence":"first","affiliation":[]},{"given":"Fernando","family":"Sousa","sequence":"additional","affiliation":[]},{"given":"Lucas","family":"Rosa","sequence":"additional","affiliation":[]},{"given":"Fernanda Lima","family":"Kastensmidt","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.259"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1982.1676066"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/24.994926"},{"key":"ref13","article-title":"Control-flow checking using assertions","author":"mcfearin","year":"0","journal-title":"Proc of IFIP International Working Conference Dependable Computing for Critical Applications (DCCA-05) Urbana-Champaign IL USA September 1995"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/71.774911"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/23.903758"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253806"},{"journal-title":"The Minimips Project","year":"2009","author":"hangout","key":"ref17"},{"journal-title":"Mentor Graphics","year":"2009","key":"ref18"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"journal-title":"International Technology Roadmap for Semiconductors","first-page":"6","year":"2005","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250158"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.10"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/24.994926"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676475"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0041"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946456"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1999.802887"}],"event":{"name":"2010 11th Latin American Test Workshop - LATW","start":{"date-parts":[[2010,3,28]]},"location":"Punta del Este, Uruguay","end":{"date-parts":[[2010,3,31]]}},"container-title":["2010 11th Latin American Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5542405\/5550333\/05550346.pdf?arnumber=5550346","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T05:28:07Z","timestamp":1489901287000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5550346\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/latw.2010.5550346","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}