{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:27:44Z","timestamp":1725539264136},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/latw.2010.5550350","type":"proceedings-article","created":{"date-parts":[[2010,8,24]],"date-time":"2010-08-24T11:37:50Z","timestamp":1282649870000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["On improving real-time observability for in-system post-silicon debug"],"prefix":"10.1109","author":[{"given":"Nicola","family":"Nicolici","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484858"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484892"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512781"},{"key":"ref6","article-title":"Distributed embedded logic analysis for post-silicon validation of SOCs","author":"ko","year":"0","journal-title":"Proc IEEE International Test Conference (ITC)"},{"key":"ref5","first-page":"69","article-title":"On by-passing blocking bugs during post-silicon validation","author":"anis daoud","year":"2008","journal-title":"Proc IEEE European Test Symposium (ETS)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.35"},{"key":"ref7","first-page":"982","article-title":"Automated data analysis solutions to silicon debug","author":"yang","year":"2009","journal-title":"Proc IEEE\/ACM Design Automation and Test in Europe (DATE)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437613"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2010.5450506"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364595"}],"event":{"name":"2010 11th Latin American Test Workshop - LATW","start":{"date-parts":[[2010,3,28]]},"location":"Punta del Este, Uruguay","end":{"date-parts":[[2010,3,31]]}},"container-title":["2010 11th Latin American Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5542405\/5550333\/05550350.pdf?arnumber=5550350","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T01:23:49Z","timestamp":1489886629000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5550350\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/latw.2010.5550350","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}