{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T06:27:38Z","timestamp":1725517658072},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/latw.2010.5550351","type":"proceedings-article","created":{"date-parts":[[2010,8,24]],"date-time":"2010-08-24T15:37:50Z","timestamp":1282664270000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Manufacturers to end-users tools for radiations induced reliability issues in electronic devices"],"prefix":"10.1109","author":[{"given":"Frederic","family":"Wrobel","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2010 11th Latin American Test Workshop - LATW","start":{"date-parts":[[2010,3,28]]},"location":"Punta del Este, Uruguay","end":{"date-parts":[[2010,3,31]]}},"container-title":["2010 11th Latin American Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5542405\/5550333\/05550351.pdf?arnumber=5550351","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T05:28:12Z","timestamp":1489901292000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5550351\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/latw.2010.5550351","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}