{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T18:04:10Z","timestamp":1725732250177},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/latw.2011.5985892","type":"proceedings-article","created":{"date-parts":[[2011,8,16]],"date-time":"2011-08-16T15:29:25Z","timestamp":1313508565000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Prediction of long-term immunity of a phase-locked loop"],"prefix":"10.1109","author":[{"given":"A.","family":"Boyer","sequence":"first","affiliation":[]},{"given":"S.","family":"Ben Dhia","sequence":"additional","affiliation":[]},{"given":"B.","family":"Li","sequence":"additional","affiliation":[]},{"given":"C.","family":"Lemoine","sequence":"additional","affiliation":[]},{"given":"B.","family":"Vrignon","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"IC-EMC User's Manual Version 2 0","year":"2009","author":"sicard","key":"ref10"},{"journal-title":"Future IEC 62433–4 integrated circuit - EMC IC Modelling - Part 4 ICIM-CI integrated circuit immunity model conducted immunity New Work Item Proposal","year":"2008","author":"marot","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.131"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.911380"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.12.004"},{"journal-title":"Microelectronics Reliability Physics-of-failure Based Modeling and Lifetime Evaluation","year":"2008","author":"white","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2007.209"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC.2010.5475776"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2009.2033577"},{"journal-title":"Integrated Circuits - Measurement of Electromagnetic Immunity -150 KHz to 1 GHz Direct RF Power Injection Method","year":"2008","key":"ref8"},{"key":"ref7","article-title":"Impact of aging on the immunity of a Mixed-signal circuit","author":"boyer","year":"0","journal-title":"EMC Europe"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2007.908255"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/b137864"},{"journal-title":"Component Technical Committee Stress Test Qualification for Integrated Circuits","year":"2003","key":"ref9"}],"event":{"name":"2011 12th Latin American Test Workshop - LATW","start":{"date-parts":[[2011,3,27]]},"location":"Beach of Porto de Galinhas, Brazil","end":{"date-parts":[[2011,3,30]]}},"container-title":["2011 12th Latin American Test Workshop (LATW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5978853\/5985882\/05985892.pdf?arnumber=5985892","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T02:32:11Z","timestamp":1490063531000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5985892\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/latw.2011.5985892","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}