{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T09:31:29Z","timestamp":1730280689282,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/latw.2011.5985906","type":"proceedings-article","created":{"date-parts":[[2011,8,16]],"date-time":"2011-08-16T15:29:25Z","timestamp":1313508565000},"page":"1-8","source":"Crossref","is-referenced-by-count":3,"title":["Impact of RF-based fault injection in Pierce-type crystal oscillators under EMC standard tests in microcontrollers"],"prefix":"10.1109","author":[{"given":"A.","family":"Olmos","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A. Vilas","family":"Boas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E. R.","family":"da Silva","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. C.","family":"Silva","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Maltione","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2003.815529"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2009.09.006"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2002.1032830"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2006.870690"},{"key":"ref14","first-page":"91","article-title":"EMI-Based Fault Injection","author":"vargas","year":"2005","journal-title":"6th IEEE Latin American Test Workshop"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/b137864"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/FREQ.1988.27619"},{"key":"ref17","first-page":"734","article-title":"Analysis and Measurement of Jitter in Crystal Oscillator","volume":"2","author":"rong","year":"2005","journal-title":"proceedings of international conference on communications circuits and systems"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.861531"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2009.4813820"},{"key":"ref4","article-title":"Microcontroller Oscillator Circuit Design Considerations","author":"cox","year":"2004","journal-title":"Freescale Semiconductor Application Note"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/4.318"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCS.2005.1511258"},{"key":"ref5","article-title":"Oscillators for Microcontrollers","volume":"an 155","author":"tom","year":"1983","journal-title":"Intel Application Note"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/15.99115"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/FREQ.2002.1075966"},{"journal-title":"Design of Crystal and Other Harmonic Oscillators","year":"1983","author":"parzen","key":"ref2"},{"article-title":"Electrical System","year":"0","author":"pierce","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.1992.626140"},{"journal-title":"Integrated Circuits measurement of electromagnetic immunity up to 1 GHz","year":"0","key":"ref20"},{"journal-title":"Electromagnetic interference and startup dynamics in high frequency crystal oscillator circuits","year":"2010","author":"rohde","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TELSKS.2009.5339500"}],"event":{"name":"2011 12th Latin American Test Workshop - LATW","start":{"date-parts":[[2011,3,27]]},"location":"Beach of Porto de Galinhas, Brazil","end":{"date-parts":[[2011,3,30]]}},"container-title":["2011 12th Latin American Test Workshop (LATW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5978853\/5985882\/05985906.pdf?arnumber=5985906","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T02:14:59Z","timestamp":1490062499000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5985906\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/latw.2011.5985906","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}