{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T02:53:49Z","timestamp":1725764029789},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/latw.2011.5985919","type":"proceedings-article","created":{"date-parts":[[2011,8,16]],"date-time":"2011-08-16T19:29:25Z","timestamp":1313522965000},"page":"1-6","source":"Crossref","is-referenced-by-count":18,"title":["On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications"],"prefix":"10.1109","author":[{"given":"R. S.","family":"Oliveira","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Semiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I. C.","family":"Teixeira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. B.","family":"Santos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. P.","family":"Teixeira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"FSCOH_D_ Databook_v1 1” FSCOH_D 0 13 um Standard Cell","year":"2004","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.76"},{"key":"ref12","first-page":"248","article-title":"Impact of Negative Bias Temperature Instability on Digital Circuit Reliability","author":"reddy","year":"0","journal-title":"Proc IEEE 40th Int Reliability Physics Symposium"},{"key":"ref13","first-page":"364","article-title":"The Impact of NBTI on the Performance of Combinational and Sequential Circuits","author":"reddy","year":"0","journal-title":"Proc ACM\/IEEE Design Automation Conf (DAC)"},{"journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits","year":"2000","author":"bushnell","key":"ref14"},{"key":"ref15","first-page":"180","article-title":"Implementation of MOSFET based Capacitors for Digital Applications","author":"bo","year":"0","journal-title":"Proc Great Lakes Symp VLSI (GLSVLSI)"},{"journal-title":"UMC 0 13um Logic 1P8M High Speed Enhancement 1 2V MOSFET SPICE Model","year":"2005","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2008.194"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2009.4796494"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810261"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195976"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469568"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457203"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2010.5560241"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEPM.2004.843109"},{"key":"ref9","first-page":"93","article-title":"Novel Low-Cost Aging Sensor","author":"omafia","year":"0","journal-title":"Proc 7th ACM Int Conf on Computing Frontiers"}],"event":{"name":"2011 12th Latin American Test Workshop - LATW","start":{"date-parts":[[2011,3,27]]},"location":"Beach of Porto de Galinhas, Brazil","end":{"date-parts":[[2011,3,30]]}},"container-title":["2011 12th Latin American Test Workshop (LATW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5978853\/5985882\/05985919.pdf?arnumber=5985919","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:03:54Z","timestamp":1490076234000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5985919\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/latw.2011.5985919","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}