{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:08:05Z","timestamp":1725383285877},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1109\/latw.2012.6261239","type":"proceedings-article","created":{"date-parts":[[2012,8,8]],"date-time":"2012-08-08T13:09:56Z","timestamp":1344431396000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Parametric DC and noise measurements in a unified test & characterization software tool framework"],"prefix":"10.1109","author":[{"given":"Jose A.","family":"Rodriguez","sequence":"first","affiliation":[]},{"given":"Manuel","family":"Jimenez","sequence":"additional","affiliation":[]},{"given":"William","family":"Morales","sequence":"additional","affiliation":[]},{"family":"Fan-Chi Hou","sequence":"additional","affiliation":[]},{"given":"Lucianne","family":"Millan","sequence":"additional","affiliation":[]},{"given":"Rogelio","family":"Palomera","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"3"},{"year":"2012","key":"2"},{"journal-title":"Analysis and Design of Analog Inegrated Circuits 4th Edition","year":"2001","author":"gray","key":"1"},{"key":"7","article-title":"A universal test set for dc and pulsed i-v characterization of various semiconductor devices","author":"kwaspen","year":"0","journal-title":"Proc Gallium Arsenide Application Symp"},{"journal-title":"Advanced On-Wafer Device Characterization Using the Summit 10500","year":"0","key":"6"},{"year":"2012","key":"5"},{"year":"2012","key":"4"}],"event":{"name":"2012 13th Latin American Test Workshop - LATW","start":{"date-parts":[[2012,4,10]]},"location":"Quito, Ecuador","end":{"date-parts":[[2012,4,13]]}},"container-title":["2012 13th Latin American Test Workshop (LATW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6247526\/6261223\/06261239.pdf?arnumber=6261239","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T17:04:33Z","timestamp":1490115873000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6261239\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/latw.2012.6261239","relation":{},"subject":[],"published":{"date-parts":[[2012,4]]}}}