{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:42:21Z","timestamp":1729676541608,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/latw.2013.6562661","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:33:21Z","timestamp":1374766401000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs"],"prefix":"10.1109","author":[{"given":"Arwa Ben","family":"Dhia","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lirida","family":"Naviner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Matherat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2004.1393259"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/PSES.2009.5356010"},{"key":"17","doi-asserted-by":"crossref","first-page":"288","DOI":"10.1109\/TVLSI.2004.824300","article-title":"The effect of LUT and cluster size on deep-sub micron FPGA performance and density","volume":"12","author":"ahmed","year":"2004","journal-title":"Very Large Scale Integration (VLSI) Systems IEEE Transactions on"},{"journal-title":"Cadence Encounter RTL Compiler","year":"0","key":"18"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2010.5603933"},{"key":"16","article-title":"A new fault-tolerant architecture for clbs in sram-based fpgas","author":"dhia","year":"2012","journal-title":"IEEE International Conference on Electronics Circuits and Systems (ICECS) Accepted for Oral Presentation"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1145\/1081081.1081106"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/RELDIS.1990.93959"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2011.5958246"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2009.5272319"},{"key":"21","first-page":"310","article-title":"Reliability analysis of combinational circuits based on a probabilistic binomial model","author":"de vasconcelos","year":"2008","journal-title":"Circuits and Systems and TAISA Conference 2008 NEWCAS-TAISA 2008 2008 Joint 6th International IEEE Northeast Workshop on"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1095890.1095915"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.06.017"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.855790"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/BF03219903"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2012.6261262"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910125"},{"key":"6","doi-asserted-by":"crossref","DOI":"10.1109\/MWSCAS.2009.5236054","article-title":"The 90 nm double-dice storage element to reduce single-event upsets","author":"haghi","year":"2009","journal-title":"Circuits and Systems 2009 MWSCAS '09 52nd IEEE International Midwest Symposium on"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.856487"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2010.48"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.47"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"}],"event":{"name":"2013 14th Latin American Test Workshop - LATW","start":{"date-parts":[[2013,4,3]]},"location":"Cordoba, Argentina","end":{"date-parts":[[2013,4,5]]}},"container-title":["2013 14th Latin American Test Workshop - LATW"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6554180\/6562651\/06562661.pdf?arnumber=6562661","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T12:50:41Z","timestamp":1498049441000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6562661\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/latw.2013.6562661","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}