{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:17:02Z","timestamp":1725783422301},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/latw.2013.6562671","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:33:21Z","timestamp":1374766401000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias"],"prefix":"10.1109","author":[{"given":"Hector","family":"Villacorta","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jose","family":"Garcia-Gervacio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Victor","family":"Champac","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sebastia","family":"Bota","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaime","family":"Martinez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaume","family":"Segura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1145\/944027.944036"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.279"},{"key":"18","first-page":"271","article-title":"Statistical delay computation considering spatial correlations","author":"agarwal","year":"2003","journal-title":"IEEE ASP-DAC"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.847517"},{"journal-title":"Reducing Power Using Body Biasing in Microprocessors with Dynamic Voltage\/frequency Scaling","year":"2010","author":"bonnoit","key":"16"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.04.001"},{"key":"14","first-page":"1271","article-title":"Dynamic critical resistance: A timing-based critical resistance model for statistical delay testing of nanometer ICs","author":"rosse","year":"2007","journal-title":"DATE"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-7427-z"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966732"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/54.20389"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805769"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5256-1"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2008.01.003"},{"journal-title":"Defect-oriented Testing-from Advances in Electronic Testing Challenges and Methodologies","year":"2006","author":"aitken","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139153"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.871626"},{"key":"6","first-page":"767","article-title":"Fault coverage analysis for physically-based cmos bridging faults at different power supply voltages","author":"liao","year":"1996","journal-title":"Proc Int Test Corif IEEE"},{"key":"5","doi-asserted-by":"crossref","first-page":"866","DOI":"10.1109\/TEST.2003.1271072","article-title":"Detection of resistive shorts in deep-submicron technologies","author":"kruseman","year":"2003","journal-title":"Proc 2003 Int Test Conf"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(00)00183-9"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.913382"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299240"}],"event":{"name":"2013 14th Latin American Test Workshop - LATW","start":{"date-parts":[[2013,4,3]]},"location":"Cordoba, Argentina","end":{"date-parts":[[2013,4,5]]}},"container-title":["2013 14th Latin American Test Workshop - LATW"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6554180\/6562651\/06562671.pdf?arnumber=6562671","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T12:50:41Z","timestamp":1498049441000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6562671\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/latw.2013.6562671","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}