{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T09:31:39Z","timestamp":1730280699215,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,3]]},"DOI":"10.1109\/latw.2014.6841898","type":"proceedings-article","created":{"date-parts":[[2014,7,28]],"date-time":"2014-07-28T21:26:12Z","timestamp":1406582772000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing"],"prefix":"10.1109","author":[{"given":"S.","family":"Ben Dhia","sequence":"first","affiliation":[]},{"given":"A.","family":"Boyer","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","article-title":"Optical and em Fault Attacks on CRT based RSA: Concrete Results","author":"schmidt","year":"2007","journal-title":"Austrochip 2007 15th Austrian Workshop on Microelectronics"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/81.554331"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC.2012.6237884"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2014.1307"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-012-5294-3"},{"key":"13","first-page":"1289","article-title":"A recipe for optimizing a timehistogram","volume":"19","author":"shimazaki","year":"2007","journal-title":"Advances in neural information processing systems"},{"key":"14","article-title":"Le signal ale?atoire","author":"declercq","year":"1996","journal-title":"Hermes"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.1989.36840"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2172116"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/EMCZUR.2006.215004"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2005.847408"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/b137864"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCDCS.2004.1393396"},{"key":"7","article-title":"A on-chip 100 GHz-sampling rate 8-channel sampling oscilloscope with embedded sampling clock generator","author":"takamiya","year":"2002","journal-title":"IEEE International Solid-State Circuits Conference"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/15.809837"},{"key":"5","article-title":"Applications of on-chip samplers for test and measurement of integrated circuits","author":"ho","year":"1998","journal-title":"IEEE Symposium on VLSI Circuits"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1049\/el:19931173"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1108\/13565360010305886"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.812313"}],"event":{"name":"2014 15th Latin American Test Workshop - LATW","start":{"date-parts":[[2014,3,12]]},"location":"Fortaleza, Brazil","end":{"date-parts":[[2014,3,15]]}},"container-title":["2014 15th Latin American Test Workshop - LATW"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6831761\/6841893\/06841898.pdf?arnumber=6841898","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T20:52:35Z","timestamp":1490302355000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6841898\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,3]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/latw.2014.6841898","relation":{},"subject":[],"published":{"date-parts":[[2014,3]]}}}