{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T07:02:32Z","timestamp":1760425352204},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/latw.2015.7102493","type":"proceedings-article","created":{"date-parts":[[2015,5,8]],"date-time":"2015-05-08T11:54:45Z","timestamp":1431086085000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["SW-based transparent in-field memory testing"],"prefix":"10.1109","author":[{"given":"Paolo","family":"Bernardi","sequence":"first","affiliation":[]},{"given":"Lyl","family":"Ciganda","sequence":"additional","affiliation":[]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Using a CISC microcontroller to test embedded memories","author":"hamdioui","year":"2010","journal-title":"Proc of the International Symposium on Design and Diagnostics of Electronic Circuits and Systems"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-006-7761-1"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.87"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1991","author":"van de goor","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1234529"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/12.543708"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48254-7_23"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1999.761206"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000868"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2002.1029769"},{"journal-title":"CENELEC","article-title":"prEN 50126–1: 2012 - Railway applications - The Specification and Demonstration of Reliability, Availability, Maintainability and Safety (RAMS)","year":"2012","key":"ref4"},{"journal-title":"«26262 - Road vehicles - Functional safety standard »","year":"2011","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2010.5617735"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.040"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527880"},{"journal-title":"IEC","article-title":"lEC 61508 - Functional safety of electrical\/electronic\/programmable electronic safety-related svsterns","year":"2010","key":"ref2"},{"journal-title":"International Technology Roadmap for Semiconductors","article-title":"Test and Test Equipment","year":"2013","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457210"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893615"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-95424-5"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000029458.57095.bb"}],"event":{"name":"2015 16th Latin-American Test Symposium (LATS)","start":{"date-parts":[[2015,3,25]]},"location":"Puerto Vallarta, Mexico","end":{"date-parts":[[2015,3,27]]}},"container-title":["2015 16th Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7101754\/7102396\/07102493.pdf?arnumber=7102493","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T14:49:36Z","timestamp":1490366976000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7102493\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/latw.2015.7102493","relation":{},"subject":[],"published":{"date-parts":[[2015,3]]}}}