{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,22]],"date-time":"2025-03-22T10:03:00Z","timestamp":1742637780589},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/latw.2015.7102505","type":"proceedings-article","created":{"date-parts":[[2015,5,8]],"date-time":"2015-05-08T11:54:45Z","timestamp":1431086085000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Rare event diagnosis by iterative failure region locating and elite learning sample selection"],"prefix":"10.1109","author":[{"given":"Hosoon","family":"Shin","sequence":"first","affiliation":[]},{"given":"Sheldon X.-D.","family":"Tan","sequence":"additional","affiliation":[]},{"given":"Guoyong","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Esteban","family":"Tlelo-Cuautle","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"69","article-title":"Mixture important sampling and its application to the analysis of sram designs in the presence of rare failure events","author":"kanj","year":"2006","journal-title":"Proc of IEEE IACM Design Automation Conference (DAC)"},{"journal-title":"Design and Analysis of Experiments","year":"2013","author":"montgomery","key":"ref11"},{"journal-title":"The Elements of Statistical Learning Data Mining Inference and Prediction","year":"2009","author":"hastie","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2307\/1269343"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.2307\/2347483"},{"key":"ref15","article-title":"Ngspice users manual","author":"nenzi","year":"2010","journal-title":"Version 25plus"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278593"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.2008.54"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2020721"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2014.6881409"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2014.6742928"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146928"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382534"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568738"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2007.911072"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456940"}],"event":{"name":"2015 16th Latin-American Test Symposium (LATS)","start":{"date-parts":[[2015,3,25]]},"location":"Puerto Vallarta, Mexico","end":{"date-parts":[[2015,3,27]]}},"container-title":["2015 16th Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7101754\/7102396\/07102505.pdf?arnumber=7102505","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T14:14:29Z","timestamp":1490364869000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7102505\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/latw.2015.7102505","relation":{},"subject":[],"published":{"date-parts":[[2015,3]]}}}