{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T12:09:46Z","timestamp":1762430986483},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/latw.2015.7102513","type":"proceedings-article","created":{"date-parts":[[2015,5,8]],"date-time":"2015-05-08T15:54:45Z","timestamp":1431100485000},"page":"1-5","source":"Crossref","is-referenced-by-count":8,"title":["Improvement of a detection chain based on a VCO concept for microelectronic reliability under natural radiative environment"],"prefix":"10.1109","author":[{"given":"K.","family":"Coulie-Castellani","sequence":"first","affiliation":[]},{"given":"W.","family":"Rahajandraibe","sequence":"additional","affiliation":[]},{"given":"H.","family":"Aziza","sequence":"additional","affiliation":[]},{"given":"J.-M.","family":"Portal","sequence":"additional","affiliation":[]},{"given":"G.","family":"Micolau","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.radmeas.2007.12.001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2003.1352057"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2007.4437190"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.radmeas.2010.08.021"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2006.07.043"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(03)01888-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.896342"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2012.6261253"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2254723"},{"article-title":"CMOS Oscillator Concept for Particle Detection, Tracking and Analysis","year":"0","author":"castellani-couli\u00e9","key":"ref19"},{"key":"ref4","article-title":"SER-History, Trends, and Challenges","author":"ziegler","year":"2004","journal-title":"Cypress Semiconductor"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.108"},{"key":"ref5","article-title":"Soft errors' impact on system reliability","author":"mastipuram","year":"2004","journal-title":"Cypress Semiconductor -- EDN"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/23.775507"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2248747"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946456"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/23.490893"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2010.11.090"},{"article-title":"Improvement of a VCO concept for low energy particule detection and recognition","year":"0","author":"castellani-couli\u00e9","key":"ref20"}],"event":{"name":"2015 16th Latin-American Test Symposium (LATS)","start":{"date-parts":[[2015,3,25]]},"location":"Puerto Vallarta, Mexico","end":{"date-parts":[[2015,3,27]]}},"container-title":["2015 16th Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7101754\/7102396\/07102513.pdf?arnumber=7102513","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T18:49:37Z","timestamp":1490381377000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7102513\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/latw.2015.7102513","relation":{},"subject":[],"published":{"date-parts":[[2015,3]]}}}