{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T12:46:03Z","timestamp":1725453963830},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/latw.2015.7102528","type":"proceedings-article","created":{"date-parts":[[2015,5,8]],"date-time":"2015-05-08T15:54:45Z","timestamp":1431100485000},"page":"1-2","source":"Crossref","is-referenced-by-count":1,"title":["In-field test of safety-critical systems: is functional test a feasible solution?"],"prefix":"10.1109","author":[{"given":"Matteo Sonza","family":"Reorda","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2013.6727120"},{"key":"ref11","article-title":"On the Automatic Generation of SBST Test Programs for In-Field Test","author":"riefert","year":"2015","journal-title":"Proceedings of Design Automation and Test in Europe Conference and Exhibition (DATE)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-012-5287-2"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243798"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.915541"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.298"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2015.7138771"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.1277902"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437646"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.166"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.7873\/DATE2014.140","article-title":"An effective approach to automatic functional processor test generation for small-delay faults","author":"riefert","year":"2014","journal-title":"Proc of the Conference on Design Automation and Test in Europe (DATE)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.43"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2252636"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675602"},{"key":"ref9","article-title":"On the Functional Test of Branch Prediction Units","author":"sanchez","year":"2014","journal-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems"}],"event":{"name":"2015 16th Latin-American Test Symposium (LATS)","start":{"date-parts":[[2015,3,25]]},"location":"Puerto Vallarta, Mexico","end":{"date-parts":[[2015,3,27]]}},"container-title":["2015 16th Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7101754\/7102396\/07102528.pdf?arnumber=7102528","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,24]],"date-time":"2019-08-24T19:51:11Z","timestamp":1566676271000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7102528\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/latw.2015.7102528","relation":{},"subject":[],"published":{"date-parts":[[2015,3]]}}}