{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:40:29Z","timestamp":1729629629201,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/latw.2016.7483339","type":"proceedings-article","created":{"date-parts":[[2016,6,23]],"date-time":"2016-06-23T16:48:27Z","timestamp":1466700507000},"page":"51-56","source":"Crossref","is-referenced-by-count":1,"title":["A control path aware metric for grading functional test vectors"],"prefix":"10.1109","author":[{"given":"Kelson","family":"Gent","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael S.","family":"Hsiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.814958"},{"key":"ref11","article-title":"Time series analysis","volume":"2","author":"hamilton","year":"1994"},{"key":"ref12","first-page":"1125","article-title":"Itc99 benchmark circuits - preliminary results","author":"davidson","year":"1999","journal-title":"Proc Int Symp Circuits & Systems"},{"journal-title":"Verilator","year":"0","key":"ref13"},{"journal-title":"Specification and Verification Language IEEE Std","article-title":"IEEE Standard for System Verilog- Unified Hardware Design","year":"2005","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297634"},{"year":"0","key":"ref16","article-title":"OpenRISC web page"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1997.582325"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2014.50"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/BF00938687"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1023\/A:1023796929359"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818739"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/24.475993"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297674"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035347"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.61"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.53"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2163651"}],"event":{"name":"2016 17th Latin-American Test Symposium (LATS)","start":{"date-parts":[[2016,4,6]]},"location":"Foz do Iguacu, Brazil","end":{"date-parts":[[2016,4,8]]}},"container-title":["2016 17th Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7477975\/7483323\/07483339.pdf?arnumber=7483339","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T15:02:44Z","timestamp":1475161364000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7483339\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/latw.2016.7483339","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}