{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:56:47Z","timestamp":1729666607246,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/latw.2016.7483343","type":"proceedings-article","created":{"date-parts":[[2016,6,23]],"date-time":"2016-06-23T16:48:27Z","timestamp":1466700507000},"page":"75-80","source":"Crossref","is-referenced-by-count":5,"title":["Gate-level modelling of NBTI-induced delays under process variations"],"prefix":"10.1109","author":[{"given":"Thiago","family":"Copetti","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guilherme","family":"Medeiros","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leticia Bolzani","family":"Poehls","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fabian","family":"Vargas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sergei","family":"Kostin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maksim","family":"Jenihhin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaan","family":"Raik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raimund","family":"Ubar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2015.53"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469614"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2011.5993802"},{"key":"ref13","first-page":"370","article-title":"NBTI-aware synthesis of digital circuits","author":"kumar","year":"2007","journal-title":"Proc Design Autom Conf"},{"volume":"3","journal-title":"Predictive Technology Model for Nano-CMOS Design Exploration ACM Journal on Emerging Technologies in Computing Systems","year":"2007","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2013.23"},{"journal-title":"Data Sheet","article-title":"74HC\/HCTI81 4-bit arithmetic logic unit","year":"1998","key":"ref16"},{"key":"ref17","article-title":"Modeling and Analyzing NBTI in the Presence of PV","author":"siddiqua","year":"2011","journal-title":"12th ISQED"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1179461.1179464"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1109\/TCAD.2013.2289874","article-title":"Cross-Layer Modeling and Simulation of Circuit Reliability","volume":"33","author":"yu","year":"2014","journal-title":"Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2214478"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2011.5985932"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703295"},{"key":"ref8","article-title":"Comparison of Reaction-Diffusion and Atomistic Trap-based BTI Models for Logic Gates, Device and Materials Reliability","author":"khan","year":"2013","journal-title":"IEEE Transactions"},{"key":"ref7","first-page":"1","article-title":"Investigating the use of an on-chip sensor to monitorNBTI effect in SRAM","volume":"10","author":"ceratti","year":"2012","journal-title":"IEEE LATW"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.876041"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.040"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2008810"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2015.7102405"}],"event":{"name":"2016 17th Latin-American Test Symposium (LATS)","start":{"date-parts":[[2016,4,6]]},"location":"Foz do Iguacu, Brazil","end":{"date-parts":[[2016,4,8]]}},"container-title":["2016 17th Latin-American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7477975\/7483323\/07483343.pdf?arnumber=7483343","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T16:56:48Z","timestamp":1498323408000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7483343\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/latw.2016.7483343","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}