{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T23:33:25Z","timestamp":1780356805003,"version":"3.54.1"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.1109\/latw.2017.7906762","type":"proceedings-article","created":{"date-parts":[[2017,4,24]],"date-time":"2017-04-24T21:12:09Z","timestamp":1493068329000},"page":"1-4","source":"Crossref","is-referenced-by-count":14,"title":["Ionizing radiation effects on a COTS low-cost RISC microcontroller"],"prefix":"10.1109","author":[{"given":"Felipe G. H.","family":"Leite","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Roberto B. B.","family":"Santos","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nilberto H.","family":"Medina","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Vitor. A. P.","family":"Aguiar","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Renato C.","family":"Giacomini","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nemitala","family":"Added","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fernando","family":"Aguirre","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Eduardo L.A.","family":"Macchione","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fabian","family":"Vargas","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Marcilei A. G.","family":"da Silveira","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/HOTCHIPS.2013.7478307"},{"key":"ref11","year":"2013","journal-title":"Freescale Semiconductor Inc KE02 Sub-Family Reference Manual Rev 3"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/630\/1\/012012"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.nimb.2014.02.105"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.nimb.2011.07.058"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2001268"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/23.983188"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2523458"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781139167758"},{"key":"ref3","volume":"50","author":"oldham","year":"2003","journal-title":"IEEE Transactions on Nuclear Science"},{"key":"ref6","year":"2016","journal-title":"JEDEC Standards Documents (2016)"},{"key":"ref5","article-title":"Radiation Effect Mechanisms in Electronic Devices","author":"silveira","year":"0","journal-title":"10th Latin American Symposium on Nuclear Physics and Applications SISSA"},{"key":"ref8","year":"2016","journal-title":"ARM Processor Architecture"},{"key":"ref7","author":"petkov","year":"2003"},{"key":"ref2","author":"johnston","year":"2010","journal-title":"World Scientific Publishing Co Pte Ltd"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.643644"},{"key":"ref9","article-title":"Single-Event Effects in Low-Cost","author":"quinn","year":"0","journal-title":"Low-Power Microprocessor IEEE Radiation Effects Data Workshop"}],"event":{"name":"2017 18th IEEE Latin American Test Symposium (LATS)","location":"Bogota, Colombia","start":{"date-parts":[[2017,3,13]]},"end":{"date-parts":[[2017,3,15]]}},"container-title":["2017 18th IEEE Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7899159\/7906734\/07906762.pdf?arnumber=7906762","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,15]],"date-time":"2017-05-15T20:16:32Z","timestamp":1494879392000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7906762\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/latw.2017.7906762","relation":{},"subject":[],"published":{"date-parts":[[2017,3]]}}}