{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T23:25:48Z","timestamp":1749165948016,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/latw.2019.8704641","type":"proceedings-article","created":{"date-parts":[[2019,5,2]],"date-time":"2019-05-02T18:53:07Z","timestamp":1556823187000},"page":"1-6","source":"Crossref","is-referenced-by-count":11,"title":["Use of ensemble methods for indirect test of RF circuits: can it bring benefits?"],"prefix":"10.1109","author":[{"given":"H.","family":"El Badawi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Azais","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Bernard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Comte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Kerzerho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Lefevre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.15"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512783"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2018.8400701"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2205480"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1201\/b12207"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401560"},{"key":"ref12","first-page":"1157","article-title":"An introduction to variable and feature selection","volume":"3","author":"guyon","year":"2003","journal-title":"Journal of Machine Learning Research"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.30"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569362"},{"key":"ref2","first-page":"9","article-title":"Combining internal probing with artficial neural networks for optimal RFIC testing","author":"ellouz","year":"2006","journal-title":"Proceedings IEEE International Test Conference (ITC)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2014.2361722"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"}],"event":{"name":"2019 IEEE Latin American Test Symposium (LATS)","start":{"date-parts":[[2019,3,11]]},"location":"Santiago, Chile","end":{"date-parts":[[2019,3,13]]}},"container-title":["2019 IEEE Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8700506\/8704547\/08704641.pdf?arnumber=8704641","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T10:48:15Z","timestamp":1658141295000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8704641\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/latw.2019.8704641","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}