{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,28]],"date-time":"2025-05-28T16:30:15Z","timestamp":1748449815204,"version":"3.37.3"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2015,7,1]],"date-time":"2015-07-01T00:00:00Z","timestamp":1435708800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100000780","name":"EC project","doi-asserted-by":"publisher","award":["FP7-612069-HARPA"],"award-info":[{"award-number":["FP7-612069-HARPA"]}],"id":[{"id":"10.13039\/501100000780","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Comput. Arch. Lett."],"published-print":{"date-parts":[[2015,7,1]]},"DOI":"10.1109\/lca.2014.2385713","type":"journal-article","created":{"date-parts":[[2014,12,23]],"date-time":"2014-12-23T21:17:12Z","timestamp":1419369432000},"page":"156-159","source":"Crossref","is-referenced-by-count":16,"title":["Tackling Performance Variability Due to RAS Mechanisms with PID-Controlled DVFS"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1408-3658","authenticated-orcid":false,"given":"Dimitrios","family":"Rodopoulos","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francky","family":"Catthoor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dimitrios","family":"Soudris","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2100531"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2013.6727090"},{"journal-title":"IEEE Trans Very Large Scale Integr Syst","article-title":"Demonstrating HW-SW transient error mitigation on the single-chip cloud computer data plane","year":"0","key":"ref12"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"1382","DOI":"10.1109\/TC.2009.56","article-title":"Reliability-aware energy management for periodic real-time tasks","volume":"58","author":"zhu","year":"2009","journal-title":"IEEE Trans Comput"},{"year":"2010","author":"munaga","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-6344-2"},{"key":"ref16","first-page":"1","article-title":"Mapping mixed-criticality applications on multi-core architectures","author":"giannopoulou","year":"0","journal-title":"Proc Design Autom Test Eur Conf Exhib"},{"key":"ref17","first-page":"1","article-title":"Partitioned mixed-criticality scheduling on multiprocessor platforms","author":"gu","year":"0","journal-title":"Proc Design Autom Test Eur Conf Exhib"},{"journal-title":"Fault-Tolerant Systems","year":"2007","author":"koren","key":"ref18"},{"year":"0","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/WMED.2013.6544494"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2034764"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488861"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2012.14"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.21141"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2289874"},{"key":"ref9","article-title":"Trends from ten years of soft error experimentation","author":"dixit","year":"0","journal-title":"IEEE Workshop on System Effects of Logic Soft Errors"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2235126"},{"year":"0","key":"ref21"}],"container-title":["IEEE Computer Architecture Letters"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10208\/7366618\/06995941.pdf?arnumber=6995941","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:28:13Z","timestamp":1642004893000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6995941\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7,1]]},"references-count":21,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/lca.2014.2385713","relation":{},"ISSN":["1556-6056"],"issn-type":[{"type":"print","value":"1556-6056"}],"subject":[],"published":{"date-parts":[[2015,7,1]]}}}