{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,12]],"date-time":"2025-12-12T13:44:02Z","timestamp":1765547042813,"version":"3.37.3"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Project CODEC of the Research Program Veni which is (partly) financed by the Dutch Research Council","award":["18244"],"award-info":[{"award-number":["18244"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Control Syst. Lett."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/lcsys.2022.3230765","type":"journal-article","created":{"date-parts":[[2022,12,20]],"date-time":"2022-12-20T18:54:51Z","timestamp":1671562491000},"page":"1039-1044","source":"Crossref","is-referenced-by-count":5,"title":["Temporal Logic Control of Nonlinear Stochastic Systems Using a Piecewise-Affine Abstraction"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1164-0508","authenticated-orcid":false,"given":"B. C.","family":"van Huijgevoort","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, Eindhoven University of Technology, Eindhoven, The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6131-4658","authenticated-orcid":false,"given":"S.","family":"Weiland","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Eindhoven University of Technology, Eindhoven, The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4749-4688","authenticated-orcid":false,"given":"S.","family":"Haesaert","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Eindhoven University of Technology, Eindhoven, The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.23919\/ECC54610.2021.9655168"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2019.05.043"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LCSYS.2020.2994039"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2020.3013916"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2022.110696"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.nahs.2022.101204"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3365365.3382214"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2021.08.486"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36801-9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2003.1272922"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2005.01.002"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00236-006-0035-7"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-50763-7"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1137\/16M1079397"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2020.3010490"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2022.110476"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.nahs.2023.101427"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3792\/euclid\/9781429799997-6"},{"issue":"3","key":"ref19","doi-asserted-by":"crossref","first-page":"291","DOI":"10.1023\/A:1011254632723","article-title":"Model checking of safety properties","volume":"19","author":"Kupferman","year":"2001","journal-title":"Formal Methods Syst. Design"},{"key":"ref20","volume-title":"Calculus: A Complete Course","volume":"4","author":"Adams","year":"2009"},{"volume-title":"Parameterized model order reduction with applications to thermal systems","year":"2021","author":"Lou","key":"ref21"},{"volume-title":"Taylor\u2019s inequality","year":"2014","author":"Weisstein","key":"ref22"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2008.09.016"},{"journal-title":"Probability theory: The coupling method","year":"2012","author":"den Hollander","key":"ref24"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.29007\/dprv"}],"container-title":["IEEE Control Systems Letters"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7782633\/9828546\/09993724.pdf?arnumber=9993724","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T12:00:58Z","timestamp":1706788858000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9993724\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/lcsys.2022.3230765","relation":{},"ISSN":["2475-1456"],"issn-type":[{"type":"electronic","value":"2475-1456"}],"subject":[],"published":{"date-parts":[[2023]]}}}