{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T22:55:51Z","timestamp":1740178551745,"version":"3.37.3"},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Control Syst. Lett."],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/lcsys.2023.3287797","type":"journal-article","created":{"date-parts":[[2023,6,20]],"date-time":"2023-06-20T17:36:46Z","timestamp":1687282606000},"page":"2701-2706","source":"Crossref","is-referenced-by-count":3,"title":["Robust Independence Tests With Finite Sample Guarantees for Synchronous Stochastic Linear Systems"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6049-4626","authenticated-orcid":false,"given":"Ambrus","family":"Tam\u00e1s","sequence":"first","affiliation":[{"name":"Eötvös Loránd Research Network, Institute for Computer Science and Control (SZTAKI), Budapest, Hungary"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D\u00e1niel \u00c1goston","family":"B\u00e1lint","sequence":"additional","affiliation":[{"name":"resides in Switzerland, Zurich, Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7079-8343","authenticated-orcid":false,"given":"Bal\u00e1zs Csan\u00e1d","family":"Cs\u00e1ji","sequence":"additional","affiliation":[{"name":"Eötvös Loránd Research Network, Institute for Computer Science and Control (SZTAKI), Budapest, Hungary"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2015.7402519"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2014.10.083"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2014.2369000"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1214\/009053607000000505"},{"key":"ref2","first-page":"585","article-title":"A kernel statistical test of independence","author":"gretton","year":"2007","journal-title":"Proc Adv Neural Inf Process Syst"},{"journal-title":"System Identification Theory for the User","year":"1999","author":"ljung","key":"ref1"},{"key":"ref8","first-page":"4427","article-title":"Semi-parametric uncertainty bounds for binary classification","author":"cs\u00e1ji","year":"2019","journal-title":"Proc 58th IEEE Conf Decis Control (CDC)"},{"journal-title":"Algorithmic Learning in a Random World","year":"2005","author":"vovk","key":"ref7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-75225-7_5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1214\/09-AOAS312"},{"key":"ref3","first-page":"1422","article-title":"A kernel independence test for random processes","author":"chwialkowski","year":"2014","journal-title":"Proc Int Conf Mach Learn"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/sta4.364"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1111\/rssb.12235"}],"container-title":["IEEE Control Systems Letters"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7782633\/9828546\/10158361.pdf?arnumber=10158361","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T18:30:05Z","timestamp":1690914605000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10158361\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/lcsys.2023.3287797","relation":{},"ISSN":["2475-1456"],"issn-type":[{"type":"electronic","value":"2475-1456"}],"subject":[],"published":{"date-parts":[[2023]]}}}