{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,14]],"date-time":"2025-05-14T04:12:37Z","timestamp":1747195957610,"version":"3.40.5"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"NSF","doi-asserted-by":"publisher","award":["2031573"],"award-info":[{"award-number":["2031573"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Control Syst. Lett."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/lcsys.2025.3566345","type":"journal-article","created":{"date-parts":[[2025,5,2]],"date-time":"2025-05-02T17:18:24Z","timestamp":1746206304000},"page":"120-125","source":"Crossref","is-referenced-by-count":0,"title":["Continuous-Time Heavy-Ball Gradient Method: Safety, Stability and Robustness"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0958-0115","authenticated-orcid":false,"given":"Karthik","family":"Shenoy","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7866-4363","authenticated-orcid":false,"given":"Arun D.","family":"Mahindrakar","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and RBCDSAI, Indian Institute of Technology Madras, Chennai, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0483-4921","authenticated-orcid":false,"given":"Umesh","family":"Vaidya","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, Clemson University, Clemson, SC, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2017.2778689"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LCSYS.2020.3006822"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2023.3306492"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CDC49753.2023.10384217"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/ECC.2019.8796030"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1214\/aop\/1176990853"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0041-5553(64)90137-5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2017.08.1513"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2016.7524935"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/b98874"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2022.3176527"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/18M1234795"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1137\/0712056"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/BF02189792"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0121215"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/ACC55779.2023.10156450"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1515\/9781400831050"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1515\/9781400841042"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LCSYS.2018.2853698"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LCSYS.2020.3004797"}],"container-title":["IEEE Control Systems Letters"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/7782633\/10939047\/10982151-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/7782633\/10939047\/10982151.pdf?arnumber=10982151","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,13]],"date-time":"2025-05-13T06:10:37Z","timestamp":1747116637000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10982151\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/lcsys.2025.3566345","relation":{},"ISSN":["2475-1456"],"issn-type":[{"type":"electronic","value":"2475-1456"}],"subject":[],"published":{"date-parts":[[2025]]}}}