{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T16:50:47Z","timestamp":1740156647733,"version":"3.37.3"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002923","name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002923","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100021778","name":"Agencia I+D+i","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100021778","id-type":"DOI","asserted-by":"crossref"}]},{"name":"FI-UNMdP, Argentina"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Embedded Syst. Lett."],"published-print":{"date-parts":[[2024,9]]},"DOI":"10.1109\/les.2024.3382615","type":"journal-article","created":{"date-parts":[[2024,3,27]],"date-time":"2024-03-27T19:13:56Z","timestamp":1711566836000},"page":"291-294","source":"Crossref","is-referenced-by-count":0,"title":["Impulsive Noise Estimator With Minimization Methods (INEMM) on Software"],"prefix":"10.1109","volume":"16","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3681-0027","authenticated-orcid":false,"given":"Lucas A.","family":"Rabioglio","sequence":"first","affiliation":[{"name":"Instituto de Investigaciones Científicas y Tecnológicas en Electrónica and Facultad de Ingeniería, Universidad Nacional de Mar del Plata, Mar del Plata, Argentina"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1798-0132","authenticated-orcid":false,"given":"M. C.","family":"Cebedio","sequence":"additional","affiliation":[{"name":"Instituto de Investigaciones Científicas y Tecnológicas en Electrónica and Facultad de Ingeniería, Universidad Nacional de Mar del Plata, Mar del Plata, Argentina"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5144-4600","authenticated-orcid":false,"given":"L.","family":"Arnone","sequence":"additional","affiliation":[{"name":"Instituto de Investigaciones Científicas y Tecnológicas en Electrónica and Facultad de Ingeniería, Universidad Nacional de Mar del Plata, Mar del Plata, Argentina"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8348-0083","authenticated-orcid":false,"given":"L.","family":"De Micco","sequence":"additional","affiliation":[{"name":"Instituto de Investigaciones Científicas y Tecnológicas en Electrónica and Facultad de Ingeniería, Universidad Nacional de Mar del Plata, Mar del Plata, Argentina"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6119-8802","authenticated-orcid":false,"given":"J. Casti\u00f1eira","family":"Moreira","sequence":"additional","affiliation":[{"name":"Instituto de Investigaciones Científicas y Tecnológicas en Electrónica and Facultad de Ingeniería, Universidad Nacional de Mar del Plata, Mar del Plata, Argentina"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2019.8694195"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2004.839380"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/RPIC.2019.8882153"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.1977.303527"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.1981.303965"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/7.4.308"},{"volume-title":"Estimador CDF","year":"2021","author":"Rabioglio","key":"ref7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/ecja.1173"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/26.41159"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/18.61127"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LES.2022.3205865"},{"journal-title":"AIC calculations","year":"2023","author":"Hyndman","key":"ref12"}],"container-title":["IEEE Embedded Systems Letters"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4563995\/10654458\/10480616.pdf?arnumber=10480616","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,31]],"date-time":"2024-08-31T05:26:11Z","timestamp":1725081971000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10480616\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9]]},"references-count":12,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/les.2024.3382615","relation":{},"ISSN":["1943-0663","1943-0671"],"issn-type":[{"type":"print","value":"1943-0663"},{"type":"electronic","value":"1943-0671"}],"subject":[],"published":{"date-parts":[[2024,9]]}}}