{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T18:44:46Z","timestamp":1766083486218,"version":"3.48.0"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Embedded Syst. Lett."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/les.2025.3548895","type":"journal-article","created":{"date-parts":[[2025,3,6]],"date-time":"2025-03-06T13:41:48Z","timestamp":1741268508000},"page":"443-446","source":"Crossref","is-referenced-by-count":0,"title":["TVI PUF: A Temperature- and Voltage-Independent PUF With High Resistance to Modeling Attacks"],"prefix":"10.1109","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0463-986X","authenticated-orcid":false,"given":"Abolfazl","family":"Rajaiyan","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, Sharif University of Technology, Tehran, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8090-109X","authenticated-orcid":false,"given":"Seyed Mojtaba","family":"Atarodi","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Sharif University of Technology, Tehran, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3265683"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3339296"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2013.2287182"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICISET54810.2022.9775831"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3267657"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2702607"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2024.3372801"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3090475"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS58744.2024.10558347"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3028514"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3233373"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2011.60"}],"container-title":["IEEE Embedded Systems Letters"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/4563995\/11302027\/10915580.pdf?arnumber=10915580","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T18:33:49Z","timestamp":1766082829000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10915580\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":12,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/les.2025.3548895","relation":{},"ISSN":["1943-0663","1943-0671"],"issn-type":[{"type":"print","value":"1943-0663"},{"type":"electronic","value":"1943-0671"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}