{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T18:53:18Z","timestamp":1766083998079,"version":"3.48.0"},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2023YFC3305901"],"award-info":[{"award-number":["2023YFC3305901"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Geosci. Remote Sensing Lett."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/lgrs.2024.3423303","type":"journal-article","created":{"date-parts":[[2024,7,4]],"date-time":"2024-07-04T13:42:41Z","timestamp":1720100561000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A Beam Rotation Error Compensation Method for TOPS SAR Data Imaging"],"prefix":"10.1109","volume":"21","author":[{"given":"JiaDong","family":"Deng","sequence":"first","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8935-294X","authenticated-orcid":false,"given":"Wei","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4727-9980","authenticated-orcid":false,"given":"HongCheng","family":"Zeng","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5332-5755","authenticated-orcid":false,"given":"YaMin","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing, China"}]},{"given":"WeiJie","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai Aerospace Electronic Technology Institute, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9370-3965","authenticated-orcid":false,"given":"Jie","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2968-2888","authenticated-orcid":false,"given":"Wei","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Kowloon, Hong Kong"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2585741"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2012.2211339"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3327297"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2006.873853"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IGARSS.2007.4422751"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IGARSS.2009.5417703"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IGARSS.2011.6049169"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2017.2735993"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IGARSS.2018.8517802"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1976.1162830"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TASLP.2020.2983589"}],"container-title":["IEEE Geoscience and Remote Sensing Letters"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8859\/10365397\/10584569.pdf?arnumber=10584569","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T18:37:17Z","timestamp":1766083037000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10584569\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/lgrs.2024.3423303","relation":{},"ISSN":["1545-598X","1558-0571"],"issn-type":[{"type":"print","value":"1545-598X"},{"type":"electronic","value":"1558-0571"}],"subject":[],"published":{"date-parts":[[2024]]}}}