{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T18:00:27Z","timestamp":1772301627918,"version":"3.50.1"},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Plan under","award":["2022YFB2803100"],"award-info":[{"award-number":["2022YFB2803100"]}]},{"DOI":"10.13039\/501100001809","name":"Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62074126"],"award-info":[{"award-number":["62074126"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Solid-State Circuits Lett."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/lssc.2025.3584266","type":"journal-article","created":{"date-parts":[[2025,6,30]],"date-time":"2025-06-30T13:40:35Z","timestamp":1751290835000},"page":"189-192","source":"Crossref","is-referenced-by-count":3,"title":["A 2 pA\/\u221aHz Input-Referred Noise TIA in 180-nm CMOS With 2.5 GHz Bandwidth for Optical Receiver"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5465-7134","authenticated-orcid":false,"given":"Yihao","family":"Yang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0721-3167","authenticated-orcid":false,"given":"Dan","family":"Li","sequence":"additional","affiliation":[{"name":"Faculty of Electronic and Information Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2267-620X","authenticated-orcid":false,"given":"Nan","family":"Qi","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Semiconductor Physics and Chip Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4040-8444","authenticated-orcid":false,"given":"Binhao","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2024.3489640"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.adk6890"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/lssc.2024.3457775"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2014.2322868"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2019.2916150"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/lssc.2024.3378093"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1364\/optica.420973"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2022.3173155"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2014.2334642"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2009.2037847"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2939652"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2015.2505264"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2012.2230495"}],"container-title":["IEEE Solid-State Circuits Letters"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8011414\/10804564\/11058975.pdf?arnumber=11058975","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,21]],"date-time":"2025-07-21T18:10:41Z","timestamp":1753121441000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11058975\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/lssc.2025.3584266","relation":{},"ISSN":["2573-9603"],"issn-type":[{"value":"2573-9603","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}