{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T07:06:10Z","timestamp":1771571170888,"version":"3.50.1"},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62504135"],"award-info":[{"award-number":["62504135"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Solid-State Circuits Lett."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/lssc.2026.3664504","type":"journal-article","created":{"date-parts":[[2026,2,13]],"date-time":"2026-02-13T20:52:11Z","timestamp":1771015931000},"page":"81-84","source":"Crossref","is-referenced-by-count":0,"title":["An Aging-Robust 32-MHz RC Frequency Reference With 0.4-ppm Allan Deviation and \u00b11550-ppm Inaccuracy From \u221240 \u00b0C to 125 \u00b0C After a 1-Point Trim"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5409-3367","authenticated-orcid":false,"given":"Sining","family":"Pan","sequence":"first","affiliation":[{"name":"School of Integrated Circuits and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-4510-0121","authenticated-orcid":false,"given":"Xiaohan","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"given":"Junlong","family":"Zeng","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-6660-2356","authenticated-orcid":false,"given":"Yihang","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2992-5467","authenticated-orcid":false,"given":"Kofi. A. A.","family":"Makinwa","sequence":"additional","affiliation":[{"name":"Microelectronics Department, Faculty of Electrical Engineering, Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8359-7997","authenticated-orcid":false,"given":"Huaqiang","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits and Beijing National Research Center for Information Science and Technology, Tsinghua University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2022.3142662"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365795"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2022.3227139"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2023.3320709"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2023.3322307"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2025.3530944"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/esserc66193.2025.11214134"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC67472.2025.11349560"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/4.760378"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2015.2417806"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067788"}],"container-title":["IEEE Solid-State Circuits Letters"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8011414\/11288938\/11395449.pdf?arnumber=11395449","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T06:38:09Z","timestamp":1771569489000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11395449\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/lssc.2026.3664504","relation":{},"ISSN":["2573-9603"],"issn-type":[{"value":"2573-9603","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}