{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T15:27:25Z","timestamp":1749655645747,"version":"3.37.3"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,11,16]],"date-time":"2022-11-16T00:00:00Z","timestamp":1668556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,16]],"date-time":"2022-11-16T00:00:00Z","timestamp":1668556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010221","name":"Higher Education Commission of Pakistan","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010221","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,11,16]]},"DOI":"10.1109\/m2vip55626.2022.10041095","type":"proceedings-article","created":{"date-parts":[[2023,2,16]],"date-time":"2023-02-16T23:01:52Z","timestamp":1676588512000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Online, Real-time and Robust Detection and Localization of Foreign Objects on Paper Surface using Machine Vision and Clustering"],"prefix":"10.1109","author":[{"given":"Muhammad Nabeel","family":"Tahir","sequence":"first","affiliation":[{"name":"Rutgers University,Department of Electrical and Computer Engineering,NJ,USA"}]},{"given":"Zubair","family":"Khalid","sequence":"additional","affiliation":[{"name":"School of Science and Engineering, Lahore University of Management Sciences,Lahore,Pakistan"}]},{"given":"Adeem","family":"Aslam","sequence":"additional","affiliation":[{"name":"University of Engineering and Technology,Department of Electrical Engineering,Lahore,Pakistan"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Automated web inspection ensures highest quality nonwovens","author":"Graf","year":"1995","journal-title":"Tappi journal (USA)"},{"key":"ref2","first-page":"817","article-title":"From hole detection to image processing and information technology","volume-title":"Proceedings of 50th Appita Annual General Conference","volume":"1","author":"Makelin"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1142\/S0218001400000507"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/amr.433-440.426"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IASP.2011.6109022"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICIA.2006.305952"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICInfA.2013.6720384"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2014.2388435"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.5937\/jaes16-19068"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2014.10.009"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/s18041064"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2020.04.106"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2019.8842998"},{"key":"ref14","article-title":"Surface defect classification in real-time using convolutional neural networks","author":"Arikan","year":"2019","journal-title":"arXiv preprint"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/app9153159"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2977366"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/s20164356"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.3036770"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/11744023_34"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/331499.331504"}],"event":{"name":"2022 28th International Conference on Mechatronics and Machine Vision in Practice (M2VIP)","start":{"date-parts":[[2022,11,16]]},"location":"Nanjing, China","end":{"date-parts":[[2022,11,18]]}},"container-title":["2022 28th International Conference on Mechatronics and Machine Vision in Practice (M2VIP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10041021\/10041042\/10041095.pdf?arnumber=10041095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T06:02:01Z","timestamp":1710396121000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10041095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11,16]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/m2vip55626.2022.10041095","relation":{},"subject":[],"published":{"date-parts":[[2022,11,16]]}}}