{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,21]],"date-time":"2023-10-21T11:10:43Z","timestamp":1697886643549},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[1980,5,1]],"date-time":"1980-05-01T00:00:00Z","timestamp":325987200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computer"],"published-print":{"date-parts":[[1980,5]]},"DOI":"10.1109\/mc.1980.1653619","type":"journal-article","created":{"date-parts":[[2007,8,22]],"date-time":"2007-08-22T20:04:20Z","timestamp":1187813060000},"page":"40-48","source":"Crossref","is-referenced-by-count":18,"title":["Visual Inspection System Design"],"prefix":"10.1109","volume":"13","author":[{"family":"Porter","sequence":"first","affiliation":[]},{"family":"Mundy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(71)90015-4"},{"key":"ref3","first-page":"952","article-title":"a laser measuring system for automatic industrial inspection","author":"himmel","year":"1978","journal-title":"Proc Fourth Int'l Joint Conf Pattern Recognition"},{"key":"ref10","first-page":"133","article-title":"sight-i: a computer vision system for automated ic chip manufacture","volume":"smc 8","author":"baird","year":"1978","journal-title":"IEEE Trans Systems Man Cybernetics"},{"key":"ref6","article-title":"recent applications of electronic vision to non-contact inspection","author":"branaman","year":"1979","journal-title":"SME Technical Paper IQ79-549 Society of Manufacturing Engineers"},{"key":"ref11","first-page":"214","article-title":"automatic inspection of artillery shell radiographs","author":"pearson","year":"1978","journal-title":"SPIE Vol 155 Image Understanding Systems and Industrial Applications"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/AO.16.002152"},{"key":"ref12","first-page":"83","article-title":"automatic visual inspection of blind holes in metal surfaces","author":"porter","year":"0","journal-title":"Proc 1979 Conf Pattern Recognition and Image Processing"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"58","DOI":"10.1117\/12.957372","article-title":"automatic visual inspection of reed relays","author":"van daele","year":"1979","journal-title":"Proc SPIE Technical Symp East"},{"key":"ref7","first-page":"144","article-title":"automatic visual inspection using syntactic analysis","author":"mundy","year":"0","journal-title":"Proc 1977 Conf Pattern Recognition and Image Processing"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674626"},{"key":"ref1","author":"boothroyd","year":"1978","journal-title":"Mechanized Assembly"},{"key":"ref9","first-page":"685","article-title":"an automatic position recognition technique for lsi assembly","author":"mese","year":"1977","journal-title":"Proc Fifth Int'l Joint Conf Artificial Intelligence"}],"container-title":["Computer"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/2\/34657\/01653619.pdf?arnumber=1653619","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:56:59Z","timestamp":1642006619000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1653619\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1980,5]]},"references-count":12,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/mc.1980.1653619","relation":{},"ISSN":["0018-9162"],"issn-type":[{"value":"0018-9162","type":"print"}],"subject":[],"published":{"date-parts":[[1980,5]]}}}