{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,5]],"date-time":"2024-07-05T16:41:25Z","timestamp":1720197685098},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[1984,10,1]],"date-time":"1984-10-01T00:00:00Z","timestamp":465436800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computer"],"published-print":{"date-parts":[[1984,10]]},"DOI":"10.1109\/mc.1984.1658965","type":"journal-article","created":{"date-parts":[[2007,9,4]],"date-time":"2007-09-04T20:35:32Z","timestamp":1188938132000},"page":"126-136","source":"Crossref","is-referenced-by-count":42,"title":["VLSI Testing"],"prefix":"10.1109","volume":"17","author":[{"family":"Williams","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"50","article-title":"testing vlsi with random access scan","author":"ando","year":"0","journal-title":"Proc Compcon 80"},{"key":"ref11","first-page":"6","article-title":"future testing of large lsi circuit cards","author":"stewart","year":"1977","journal-title":"Semiconductor Test Symp"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1978.1585196"},{"key":"ref13","first-page":"266","article-title":"a logic design structure for testing internal arrays","author":"eichelberger","year":"1978","journal-title":"Proc Third USA-Japan Computer Conf"},{"key":"ref14","first-page":"19","article-title":"random patterns w'ithin a structured sequential logic design","author":"williams","year":"1977","journal-title":"Proc 1977 Semiconductor Test Symp"},{"key":"ref15","first-page":"37","article-title":"built-in logic block observation techniques","author":"koenemann","year":"1979","journal-title":"Proc 1979 Test Conf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675717"},{"key":"ref17","first-page":"183","article-title":"verification testing","author":"mccluskey","year":"1982","journal-title":"1982 Int'l Test Conf"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1147\/rd.282.0212"},{"key":"ref19","first-page":"200","article-title":"self-testing of multichip logic modules","author":"bardell","year":"1982","journal-title":"1982 Int'l Test Conf"},{"key":"ref4","first-page":"80","article-title":"the history and theory of stuck-at-faults","author":"williams","year":"0","journal-title":"Proc Sixth European Conf Circuit Theory and Design"},{"key":"ref3","author":"friedman","year":"1971","journal-title":"Fault Detection in Digital Circuits"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1983.12531"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1978.tb02106.x"},{"key":"ref8","first-page":"462","article-title":"a logic design structure for lsi testing","author":"eichelberger","year":"1977","journal-title":"Proc 14th Design Automation Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223600"},{"key":"ref2","author":"chang","year":"1970","journal-title":"Fault Diagnosis of Digital Systems"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/320954.320957"},{"key":"ref9","first-page":"114","article-title":"test generation systems in japan","author":"funatsu","year":"1975","journal-title":"Proc 12th Design Automation Symp"},{"key":"ref20","article-title":"testability and maintainability with a new 6k gate array","author":"resnick","year":"1983","journal-title":"VLSI Design"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676470"},{"key":"ref21","first-page":"29","article-title":"design for testability of the ibm system\/ 38","author":"stolte","year":"1979","journal-title":"Proc Test Conf"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1147\/rd.273.0265"}],"container-title":["Computer"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/2\/34736\/01658965.pdf?arnumber=1658965","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:57:50Z","timestamp":1642006670000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1658965\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1984,10]]},"references-count":23,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/mc.1984.1658965","relation":{},"ISSN":["0018-9162"],"issn-type":[{"value":"0018-9162","type":"print"}],"subject":[],"published":{"date-parts":[[1984,10]]}}}