{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T23:53:57Z","timestamp":1772236437669,"version":"3.50.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000015","name":"US Department of Energy","doi-asserted-by":"publisher","award":["FP 217984"],"award-info":[{"award-number":["FP 217984"]}],"id":[{"id":"10.13039\/100000015","id-type":"DOI","asserted-by":"publisher"}]},{"name":"European Union Horizon 2020","award":["732016"],"award-info":[{"award-number":["732016"]}]},{"name":"Germany Federal Ministry of Education and Research","award":["01IS19044"],"award-info":[{"award-number":["01IS19044"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computer"],"published-print":{"date-parts":[[2021,1]]},"DOI":"10.1109\/mc.2020.3029975","type":"journal-article","created":{"date-parts":[[2021,1,14]],"date-time":"2021-01-14T20:34:05Z","timestamp":1610656445000},"page":"49-60","source":"Crossref","is-referenced-by-count":6,"title":["Understanding and Fixing Complex Faults in Embedded Cyberphysical Systems"],"prefix":"10.1109","volume":"54","author":[{"given":"Alexander","family":"Weiss","sequence":"first","affiliation":[{"name":"Accemic Technologies, Dresden, Germany"}]},{"given":"Smitha","family":"Gautham","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, Virginia United States"}]},{"given":"Athira Varma","family":"Jayakumar","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, Virginia United States"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5315-2698","authenticated-orcid":false,"given":"Carl R.","family":"Elks","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, Virginia Commonwealth University, Richond, Virginia United States"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0050-1596","authenticated-orcid":false,"given":"D. Richard","family":"Kuhn","sequence":"additional","affiliation":[{"name":"Computer Security, National Institute of Standards & Technology, Gaithersburg, Maryland United States"}]},{"given":"Raghu N.","family":"Kacker","sequence":"additional","affiliation":[{"name":"Applied and Computational Mathematics, National Institute of Standards and Technology, Gaithersburg, Maryland United States"}]},{"given":"Thomas B.","family":"Preusser","sequence":"additional","affiliation":[{"name":"Accemic Technologies, Dresden, Germany"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jlap.2008.08.004"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-38209-3_3"},{"key":"ref12","first-page":"19","article-title":"Combining testing and runtime verification","author":"colombo","year":"0","journal-title":"Proc Comput Sci Annu Workshop (CSAW’12)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-16612-9_26"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-03044-5_10"},{"key":"ref15","year":"2020"},{"key":"ref16","first-page":"8","article-title":"Systematic software testing of critical embedded digital devices in nuclear power applications","author":"jayakumar","year":"0","journal-title":"Proc IEEE Int Symp Software Rel Eng (ISSRE)"},{"key":"ref17","author":"elks","year":"2019","journal-title":"Preliminary results of a bounded exhaustive testing study for software in embedded digital devices in nuclear power applications"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/SEW.2006.26"},{"key":"ref19","year":"0","journal-title":"TESSY Test System"},{"key":"ref4","year":"1992","journal-title":"Patriot missile defense Software problem led to system failure at Dhahran Saudi Arabia"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2010.5544284"},{"key":"ref6","year":"2013","journal-title":"CoreSight™ Architecture Specification v2 0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSREW.2016.26"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342124"},{"key":"ref7","year":"2016","journal-title":"64 and IA-32 Architectures Software Developer's Manual"},{"key":"ref2","author":"zeller","year":"2009","journal-title":"Why Programs Fail A Guide to Systematic Debugging"},{"key":"ref1","year":"2010"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2020.2978567"},{"key":"ref20","author":"eagle","year":"2011","journal-title":"The IDA Pro Book The Unofficial Guide to the World’s Most Popular Disassembler"}],"container-title":["Computer"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/2\/9321788\/9324891-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/2\/9321788\/09324891.pdf?arnumber=9324891","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:48:21Z","timestamp":1652194101000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9324891\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,1]]},"references-count":20,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mc.2020.3029975","relation":{},"ISSN":["0018-9162","1558-0814"],"issn-type":[{"value":"0018-9162","type":"print"},{"value":"1558-0814","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,1]]}}}