{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T19:19:43Z","timestamp":1648840783378},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2013,8,1]],"date-time":"2013-08-01T00:00:00Z","timestamp":1375315200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2013,8]]},"DOI":"10.1109\/mdat.2013.2273791","type":"journal-article","created":{"date-parts":[[2013,7,17]],"date-time":"2013-07-17T18:02:28Z","timestamp":1374084148000},"page":"26-34","source":"Crossref","is-referenced-by-count":2,"title":["Deriving Feature Fail Rate from Silicon Volume Diagnostics Data"],"prefix":"10.1109","volume":"30","author":[{"given":"Shobhit","family":"Malik","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Herrmann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sriram","family":"Madhavan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rao","family":"Desineni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chris","family":"Schuermyer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Geir","family":"Eide","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","year":"0","journal-title":"MedIA"},{"key":"ref11","year":"0","journal-title":"Quartile"},{"key":"ref12","year":"0","journal-title":"Outliers"},{"key":"ref13","article-title":"A logic diagnosis methodology for improved localization and extraction of accurate defect behavior","author":"desineni","year":"2006","journal-title":"Proc Int Test Conf"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178386"},{"key":"ref15","article-title":"Optimizing yield and performance in a nanometer world","author":"eide","year":"2011","journal-title":"Tech Design Forum"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.117"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178587"},{"key":"ref4","author":"schuermyer","year":"2012","journal-title":"Correlating design for manufacturing critical features to silicon defects using layout-aware diagnosis"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2010.5551472"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/66.53188"},{"key":"ref5","year":"0","journal-title":"Poisson Distribution"},{"key":"ref8","first-page":"61","article-title":"Reducing baseline defect density through modeling random defect-limited yield","author":"segal","year":"2000","journal-title":"Microwave Mag"},{"key":"ref7","first-page":"12","article-title":"Experiences with layout-aware diagnosis VA case study","volume":"12","author":"chang","year":"2010","journal-title":"Electron Device Failure Anal"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2012.6212858"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0471790281"},{"key":"ref9","year":"0","journal-title":"Box Plot"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/6658894\/06562792.pdf?arnumber=6562792","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:43:44Z","timestamp":1642005824000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6562792\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,8]]},"references-count":17,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2013.2273791","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,8]]}}}