{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,18]],"date-time":"2026-02-18T22:28:54Z","timestamp":1771453734359,"version":"3.50.1"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2014,6,1]],"date-time":"2014-06-01T00:00:00Z","timestamp":1401580800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1109\/mdat.2014.2313080","type":"journal-article","created":{"date-parts":[[2014,3,24]],"date-time":"2014-03-24T23:08:12Z","timestamp":1395702492000},"page":"65-75","source":"Crossref","is-referenced-by-count":6,"title":["Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis"],"prefix":"10.1109","volume":"31","author":[{"given":"Fangming","family":"Ye","sequence":"first","affiliation":[{"name":"Duke Univ., Durham, NC, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Krishnenedu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"Duke Univ., Durham, NC, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhaobo","family":"Zhang","sequence":"additional","affiliation":[{"name":"Huawei Technol., Santa Clara, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinli","family":"Gu","sequence":"additional","affiliation":[{"name":"Huawei Technol., Santa Clara, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2182984"},{"key":"ref3","first-page":"181","article-title":"Defect coverage of boundary-scan tests: What does it mean when a boundary-scan test passes?","author":"parker","year":"0","journal-title":"Proc Int Test Conf"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.48"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/5326.971655"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651918"},{"key":"ref5","first-page":"1","article-title":"A model based automated debug process","author":"manley","year":"0","journal-title":"Proc IEEE Board Test Workshop"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2005.159"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569364"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583974"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5243-6"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"723","DOI":"10.1109\/TCAD.2012.2234827","article-title":"Board-level functional fault diagnosis using artificial neural networks, support-vector machines, weighted-majority voting","volume":"32","author":"ye","year":"2013","journal-title":"IEEE Trans Comput -Aided Design Integr Circuits Syst"},{"key":"ref1","article-title":"Design for board and system level structural test and diagnosis","author":"vo","year":"0","journal-title":"Proc Int Test Conf"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/6862938\/06777578.pdf?arnumber=6777578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,18]],"date-time":"2026-02-18T21:20:57Z","timestamp":1771449657000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6777578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":12,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2014.2313080","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,6]]}}}