{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:36:27Z","timestamp":1740170187428,"version":"3.37.3"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2017,2,1]],"date-time":"2017-02-01T00:00:00Z","timestamp":1485907200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2017,2]]},"DOI":"10.1109\/mdat.2016.2527998","type":"journal-article","created":{"date-parts":[[2016,2,10]],"date-time":"2016-02-10T19:23:07Z","timestamp":1455132187000},"page":"65-76","source":"Crossref","is-referenced-by-count":0,"title":["Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms"],"prefix":"10.1109","volume":"34","author":[{"given":"Wisam","family":"Kadry","sequence":"first","affiliation":[]},{"given":"Dimtry","family":"Krestyashyn","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3462-3129","authenticated-orcid":false,"given":"Arkadiy","family":"Morgenshtein","sequence":"additional","affiliation":[]},{"given":"Amir","family":"Nahir","sequence":"additional","affiliation":[]},{"given":"Vitali","family":"Sokhin","sequence":"additional","affiliation":[]},{"given":"Jin Sung","family":"Park","sequence":"additional","affiliation":[]},{"given":"Sung-Boem","family":"Park","sequence":"additional","affiliation":[]},{"given":"Wookyeong","family":"Jeong","sequence":"additional","affiliation":[]},{"given":"Jae Cheol","family":"Son","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","DOI":"10.1609\/icaps.v21i1.13442","article-title":"Scalable scheduling for hardware-accelerated functional verification","author":"moffitt","year":"2011","journal-title":"Proc Int Conf Autom Planning Scheduling"},{"article-title":"Building transaction-based acceleration regression environment using plan-driven verification approach","year":"0","author":"matalon","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228531"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176449"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.1277900"},{"key":"ref15","first-page":"60","article-title":"Reaching coverage closure in post-silicon validation","author":"adir","year":"2010","journal-title":"Proc Haifa Verif Conf"},{"year":"0","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593183"},{"key":"ref4","article-title":"From volume to velocity: The transforming landscape in function verification","author":"foster","year":"2011","journal-title":"Proc Design Verif Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837300"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024916"},{"article-title":"Designer view: Embedded Palladium Testbench speeds system bring-up","year":"2013","author":"goering","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1054907.1054910"},{"key":"ref7","first-page":"146","article-title":"Advances in simultaneous multithreading test-case generation methods","author":"ludden","year":"2010","journal-title":"Proc Haifa Verif Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2011.2117370"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.898827"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2485922.2485942"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/7815449\/07403914.pdf?arnumber=7403914","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,14]],"date-time":"2024-06-14T08:41:01Z","timestamp":1718354461000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7403914\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,2]]},"references-count":17,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2016.2527998","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2017,2]]}}}