{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T21:00:44Z","timestamp":1772830844168,"version":"3.50.1"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1109\/mdat.2016.2590987","type":"journal-article","created":{"date-parts":[[2016,7,14]],"date-time":"2016-07-14T00:38:34Z","timestamp":1468456714000},"page":"55-62","source":"Crossref","is-referenced-by-count":1,"title":["Symbolic Quick Error Detection for Pre-Silicon and Post-Silicon Validation: Frequently Asked Questions"],"prefix":"10.1109","volume":"33","author":[{"given":"Eshan","family":"Singh","sequence":"first","affiliation":[]},{"given":"David","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Clark","family":"Barrett","sequence":"additional","affiliation":[]},{"given":"Subhasish","family":"Mitra","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228461"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699215"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.1995.524546"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.1012"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2014.6742898"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2334301"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583992"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342397"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2753768"},{"key":"ref2","article-title":"Post-silicon debug—DAC workshop on post-silicon debug: Technologies, methodologies, and \nbest-practices","author":"reick","year":"0","journal-title":"Proc IEEE\/ACM Design Autom Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1023\/A:1011276507260"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837278"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/7604039\/07511763.pdf?arnumber=7511763","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:40:17Z","timestamp":1642005617000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7511763\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,12]]},"references-count":12,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2016.2590987","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,12]]}}}