{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:36:28Z","timestamp":1740170188689,"version":"3.37.3"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2017,12,1]],"date-time":"2017-12-01T00:00:00Z","timestamp":1512086400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100003662","name":"Korea Evaluation Institute of Industrial Technology","doi-asserted-by":"publisher","award":["10052716"],"award-info":[{"award-number":["10052716"]}],"id":[{"id":"10.13039\/501100003662","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","award":["2650.001"],"award-info":[{"award-number":["2650.001"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2015M3D1A1070465","2016R1A2B4015329"],"award-info":[{"award-number":["2015M3D1A1070465","2016R1A2B4015329"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2017,12]]},"DOI":"10.1109\/mdat.2016.2615844","type":"journal-article","created":{"date-parts":[[2016,10,7]],"date-time":"2016-10-07T14:56:47Z","timestamp":1475852207000},"page":"84-93","source":"Crossref","is-referenced-by-count":5,"title":["Adaptive ECC for Tailored Protection of Nanoscale Memory"],"prefix":"10.1109","volume":"34","author":[{"given":"Dongyeob","family":"Shin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jongsun","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jangwon","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Somnath","family":"Paul","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Swarup","family":"Bhunia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.912983"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2004.1276550"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2235126"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.203"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2239098"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/40.877951"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1013235.1013273"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2013.6674841"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2013.2291091"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065780"},{"journal-title":"Error Control Coding","year":"2004","author":"lin","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2180447"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/8107686\/07586136.pdf?arnumber=7586136","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:41:26Z","timestamp":1641987686000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7586136\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12]]},"references-count":12,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2016.2615844","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2017,12]]}}}